EN 50513:2009

1 Scope
2 Normative references
3 Terms, definitions and acronyms
4 Crystallisation process
5 Product characteristics
6 Packaging, marking and storage
7 Major changes of product and processes
8 Wafer thickness
9 Variations in thickness
10 Waviness and warping
11 Grooves and step type saw mark
12 Corrosion rate
13 Determining carrier lifetime measured on as cut wafer
14 Determining minority carrier bulk lifetime measured
   on passivated wafers (laboratory measurement)
15 Electrical resistivity of multi and mono crystalline
   semiconductor wafers
16 Method for the measurement of substitutional atomic
   carbon and interstitial oxygen content in silicon
   used as solar material
Annex A (informative) - Geometric dimensions, surfaces and
                        edge characteristics
Annex B (informative) - Optional requirements
Bibliography

This document describes data sheet and product information for crystalline silicon (Si) – solar wafers and measurement methods for wafer properties. The document intends to provide the minimum information required for an optimal use of crystalline silicon wafers in solar cell manufacturing. Clauses 5 to 7 describe the data sheet information with technical specifications of the silicon solar wafer with all essential characteristics. The product information concerns packaging, labelling and storage, and implies the commitment to inform about major changes of the product and in the manufacturing process. This data is needed for the processing of silicon solar wafers to solar cells. Clauses 8 to 16 describe measurement methods for the characteristic properties specified in the data sheet.