EN 60384-1:2016

FOREWORD
INTRODUCTION
1 General
2 Technical data
3 Quality assessment procedures
4 Tests and measurement procedures
Annex A (informative) - Interpretation of sampling plans
        and procedures as described in IEC 60410 for use
        within quality assessment systems
Annex B (informative) - Rules for the preparation of
        detail specifications for capacitors and resistors
        for electronic equipment for use within quality
        assessment systems
Annex C (informative) - Layout of the first page of a
        PCP/CQC specification
Annex D (informative) - Requirements for capability approval
        test report
Annex E (informative) - Guide for pulse testing of capacitors
Annex F (informative) - Guidance for the extension of
        endurance tests on fixed capacitors
Annex G (normative) - Damp heat, steady state with voltage
        applied, for metallized film capacitors only
Annex H (normative) - Accelerated damp heat, steady state,
        for multilayer ceramic capacitors only
Annex Q (informative) - Quality assessment procedures
Bibliography
Annex ZA (normative) - Normative references to international
         publications with their corresponding European
         publications

IEC 60384-1:2016 is available as IEC 60384-1:2016 RLV which contains the International Standard and its Redline version, showing all changes of the technical content compared to the previous edition.


IEC 60384-1:2016 is a generic specification and is applicable to fixed capacitors for use in electronic equipment. It establishes standard terms, inspection procedures and methods of test for use in sectional and detail specifications of electronic components for quality assessment or any other purpose. This edition contains the following significant technical changes with respect to the previous edition:

- INTRODUCTION added;

- 4.41 Whisker growth test added;

- Annex Q completely restructured.