EN 60444-5:1997
Current
The latest, up-to-date edition.
Measurement of quartz crystal unit parameters - Part 5: Methods for the determination of equivalent electrical parameters using automatic network analyzer techniques and error correction
17-04-1997
Committees responsible
National foreword
Methods
1 Scope
2 Introduction
3 Measurement procedures
4 Choice of admittance measurement method
5 Calibration techniques
6 Low-frequency measurements
7 Admittance analysis and estimation of the equivalent
circuit parameters
8 Measurement errors, instrumentation and test fixtures
Annexes
A (normative) Calibration
B (informative) Low-frequency measurement
C (informative) Bibliography
Figures
1 Measurement sequence
2 Measurement methods, admittance analysis and parameter
estimation techniques
3 One-port equivalent circuit of a single-mode quartz
crystal unit
4 Two-port equivalent circuit of a single-mode quartz
crystal unit
5 Admittance and impedance circle of a quartz crystal
unit for frequencies near an isolated mode of vibration
6 General one-port equivalent circuit for multiple
resonance
7 Two-port equivalent circuit for multiple resonances
8 Procedure for the determination of the equivalent
circuit parameters of a quartz crystal unit
9 Calibration verification for S-parameter measurement
10 APC-3.5 Transmission fixture
11 APC-7 Transmission fixture
12 APC-7 Reflection fixture
13 APC-3.5 One-port fixture
14 APC 3.5 Two-port fixture
15 Direct transmission measurement fixture
A.1 Simplified one-port network analyzer
A.2 Simplified two-port, three-channel network analyzer
A.3 Signal flowgraph representation for proposed
12-term error model
A.4 Typical direct transmission system
A.5 Equivalent circuit for direct transmission method
A.6 Thin-film calibration resistor
A.7 Modified SMA terminating resistor
B.1 Simplified network analyzer test system for
low-frequency measurements
B.2 1 : 2 Directional bridge for low-frequency
measurements
B.3 1 : 1 Directional bridge for low-frequency
measurements
Annex ZA (normative) Normative references to international
publications with their corresponding European publications
Gives methods for determining the best representations of modes in quartz crystal resonators by linear equivalent circuits.
Committee |
CLC/SR 49
|
DocumentType |
Standard
|
PublisherName |
European Committee for Standards - Electrical
|
Status |
Current
|
Standards | Relationship |
IEC 60444-5:1995 | Identical |
PN EN 60444-5 : 2001 | Identical |
NEN EN IEC 60444-5 : 1997 | Identical |
UNE-EN 60444-5:1997 | Identical |
I.S. EN 60444-5:1999 | Identical |
SN EN 60444-5 : 1997 | Identical |
NBN EN 60444-5 : 1997 | Identical |
DIN EN 60444-5:1997-10 | Identical |
NF EN 60444-5 : 2001 | Identical |
BS EN 60444-5:1997 | Identical |
CEI EN 60444-8 : 2004 | MEASUREMENT OF QUARTZ CRYSTAL UNIT PARAMETERS - PART 8: TEST FIXTURE FOR SURFACE MOUNTED QUARTZ CRYSTAL UNITS |
I.S. EN 60444-8:2017 | MEASUREMENT OF QUARTZ CRYSTAL UNIT PARAMETERS - PART 8: TEST FIXTURE FOR SURFACE MOUNTED QUARTZ CRYSTAL UNITS |
EN 60444-8:2017 | Measurement of quartz crystal unit parameters - Part 8 : Test fixture for surface mounted quartz crystal units |
I.S. EN 60444-6:2013 | MEASUREMENT OF QUARTZ CRYSTAL UNIT PARAMETERS - PART 6: MEASUREMENT OF DRIVE LEVEL DEPENDENCE (DLD) (IEC 60444-6:2013 (EQV)) |
EN 60444-6:2013 | Measurement of quartz crystal unit parameters - Part 6: Measurement of drive level dependence (DLD) |
BS EN 60444-6:2013 | Measurement of quartz crystal unit parameters Measurement of drive level dependence (DLD) |
CEI EN 60122-1 : 2004 | QUARTZ CRYSTAL UNITS OF ASSESSED QUALITY - PART 1: GENERIC SPECIFICATION |
EN 60444-11:2010 | Measurement of quartz crystal unit parameters - Part 11: Standard method for the determination of the load resonance frequency fL and the effective load capacitance CLeff using automatic network analyzer techniques and error correction |
BS EN 60444-11:2010 | Measurement of quartz crystal unit parameters Standard method for the determination of the load resonance frequency ƒL and the effective load capacitance CLeff using automatic network analyzer techniques and error correction |
BS EN 60444-8:2017 | Measurement of quartz crystal unit parameters Test fixture for surface mounted quartz crystal units |
CEI EN 60444-11 : 2011 | MEASUREMENT OF QUARTZ CRYSTAL UNIT PARAMETERS - PART 11: STANDARD METHOD FOR THE DETERMINATION OF THE LOAD RESONANCE FREQUENCY F[L] AND THE EFFECTIVE LOAD CAPACITANCE C[LEFF] USING AUTOMATIC NETWORK ANALYZER TECHNIQUES AND ERROR CORRECTION |
BS EN 60122-1 : 2002 | QUARTZ CRYSTAL UNITS OF ASSESSED QUALITY - PART 1: GENERIC SPECIFICATION |
I.S. EN 60122-1:2002 AMD 1 2018 | QUARTZ CRYSTAL UNITS OF ASSESSED QUALITY - PART 1: GENERIC SPECIFICATION |
CEI EN 60444-6 : 2014 | MEASUREMENT OF QUARTZ CRYSTAL UNIT PARAMETERS - PART 6: MEASUREMENT OF DRIVE LEVEL DEPENDENCE (DLD) |
I.S. EN 60444-11:2010 | MEASUREMENT OF QUARTZ CRYSTAL UNIT PARAMETERS - PART 11: STANDARD METHOD FOR THE DETERMINATION OF THE LOAD RESONANCE FREQUENCY F[L] AND THE EFFECTIVE LOAD CAPACITANCE C[LEFF] USING AUTOMATIC NETWORK ANALYZER TECHNIQUES AND ERROR CORRECTION |
EN 60122-1:2002/A1:2018 | QUARTZ CRYSTAL UNITS OF ASSESSED QUALITY - PART 1: GENERIC SPECIFICATION (IEC 60122-1:2002/A1:2017) |
IEC 61080:1991 | Guide to the measurement of equivalent electrical parameters of quartz crystal units |
IEC 60302:1969 | Standard definitions and methods of measurement for piezoelectric vibrators operating over the frequency range up to 30 MHz |
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