EN 60749-3:2017

FOREWORD
1 Scope
2 Normative references
3 Terms and definitions
4 Test apparatus
5 Procedure
6 Failure criteria
7 Summary
Annex A (informative) - External visual report form/checklist
        (example only - not a mandatory template)
Bibliography
Annex ZA (normative) - Normative references to international
         Publications with their corresponding
         European publications

IEC 60749-3:2017(E) is to verify that the materials, design, construction, markings, and workmanship of a semiconductor device are in accordance with the applicable procurement document. External visual inspection is a non-destructive test and applicable for all package types. The test is useful for qualification, process monitor, or lot acceptance.This edition includes the following significant technical changes with respect to the previous edition:a) reference to the need for ESD protection;b) inclusion of information on the phenomenon of tin whiskers;c) inclusion of an optional report form/checklist.