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SEMICONDUCTOR DEVICES - MECHANICAL AND CLIMATIC TEST METHODS - PART 3: EXTERNAL VISUAL EXAMINATION
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Withdrawn date: 05-10-2021
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Published date: 12-01-2013
Publisher: Association Francaise de Normalisation
Foreword1 Scope2 Test apparatus3 Procedure4 Failure criteria5 Summary
Verifies that the materials, design, construction, markings, and workmanship of a semiconductor device are in accordance with the applicable procurement document.
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