EN 60749-44:2016
Current
The latest, up-to-date edition.
Semiconductor devices - Mechanical and climatic test methods - Part 44: Neutron beam irradiated single event effect (SEE) test method for semiconductor devices
21-10-2016
FOREWORD
1 Scope
2 Normative references
3 Terms and definitions
4 Test apparatus
5 Procedure neutron irradiated soft error test
6 Evaluation
7 Summary
Annex A (informative) - Additional information
for the applicable procurement specification
Annex B (informative) - White neutron test apparatus
Annex C (informative) - Failure rate calculation
Bibliography
IEC 60749-44:2016 establishes a procedure for measuring the single event effects (SEEs) on high density integrated circuit semiconductor devices including data retention capability of semiconductor devices with memory when subjected to atmospheric neutron radiation produced by cosmic rays. The single event effects sensitivity is measured while the device is irradiated in a neutron beam of known flux. This test method can be applied to any type of integrated circuit.
NOTE 1 - Semiconductor devices under high voltage stress can be subject to single event effects including SEB, single event burnout and SEGR single event gate rupture, for this subject which is not covered in this document, please refer to IEC 62396-4.
NOTE 2 - In addition to the high energy neutrons some devices can have a soft error rate due to low energy (
| Committee |
CLC/TC 47X
|
| DocumentType |
Standard
|
| PublisherName |
European Committee for Standards - Electrical
|
| Status |
Current
|
| Standards | Relationship |
| PN EN 60749-44 : 2017 | Identical |
| UNE-EN 60749-44:2016 | Identical |
| BIS IS/IEC 61558-2-6 : 1ED 2016 | Identical |
| DIN EN 60749-44:2017-04 | Identical |
| CEI EN 60749-44 : 1ED 2017 | Identical |
| BS EN 60749-44:2016 | Identical |
| IEC 60749-44:2016 | Identical |
| NF EN 60749-44 : 2016 | Identical |
| NEN EN IEC 60749-44 : 2016 | Identical |
| SN EN 60749-44:2016 | Identical |
| PNE-FprEN 60749-44 | Identical |
| BIS IS/IEC 61558-2-6 : 1ED 2016 | Identical |
| IEC 60749-38:2008 | Semiconductor devices - Mechanical and climatic test methods - Part 38: Soft error test method for semiconductor devices with memory |
| IEC 62396-4:2013 | Process management for avionics - Atmospheric radiation effects - Part 4: Design of high voltage aircraft electronics managing potential single event effects |
| IEC 62396-5:2014 | Process management for avionics - Atmospheric radiation effects - Part 5: Assessment of thermal neutron fluxes and single event effects in avionics systems |
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