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EN IEC 60749-13:2018

Current

Current

The latest, up-to-date edition.

Semiconductor devices - Mechanical and climatic test methods - Part 13: Salt atmosphere

Published date

13-04-2018

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FOREWORD
1 Scope
2 Normative references
3 Terms and definitions
4 Test apparatus
5 Procedure
6 Summary
Bibliography
Annex ZA (normative) - Normative references to international
         publications with their corresponding European
         publications

IEC60749-13:2018 describes a salt atmosphere test that determines the resistance of semiconductor devices to corrosion. It is an accelerated test that simulates the effects of severe sea-coast atmosphere on all exposed surfaces. It is only applicable to those devices specified for a marine environment.The salt atmosphere test is considered destructive.This edition includes the following significant technical changes with respect to the previous edition:a) alignment with MIL-STD-883J Method 1009.8, Salt Atmosphere (Corrosion), including information on conditioning and maintenance of the test chamber and mounting of test specimens (including explanatory figures).

Committee
CLC/TC 47X
DevelopmentNote
Supersedes & Redesignates EN 60749-13. (04/2018)
DocumentType
Standard
PublisherName
European Committee for Standards - Electrical
Status
Current
Supersedes

MIL-STD-883 Revision K:2016 TEST METHOD STANDARD - MICROCIRCUITS
IEC 60749-14:2003 Semiconductor devices - Mechanical and climatic test methods - Part 14: Robustness of terminations (lead integrity)
EN 60749-14:2003 Semiconductor devices - Mechanical and climatic test methods - Part 14: Robustness of terminations (lead integrity)

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