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CENELEC
EN IEC 62884-3:2018

EN IEC 62884-3:2018

Current

Current

The latest, up-to-date edition.

Measurement techniques of piezoelectric, dielectric and electrostatic oscillators – Part 3: Frequency aging test methods

Published date

18-05-2018

Publisher

European Committee for Standards - Electrical

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FOREWORD
INTRODUCTION
1 Scope
2 Normative references
3 Terms and definitions, units and symbols
4 Frequency aging test
Annex A (normative) - Experimental verification of the
        frequency aging performance
Bibliography
Annex ZA (normative) - Normative references to
         international publications with their
         corresponding European publications

IEC62884-3:2018(E) describes the methods for the measurement and evaluation of frequency aging tests of piezoelectric, dielectric and electrostatic oscillators, including Dielectric Resonator Oscillators (DRO) and oscillators using FBAR (hereinafter referred to as "Oscillator"). The purpose of those tests is to provide statistical data supporting aging predictions.This document was developed from the works related to IEC60679-1:2007 (third edition), the measurement techniques of which were restructured into different parts under a new project reference. This document describes the measurement method for frequency aging only.

Committee
CLC/SR 49
DocumentType
Standard
PublisherName
European Committee for Standards - Electrical
Status
Current

IEC 62884-1:2017 Measurement techniques of piezoelectric, dielectric and electrostatic oscillators - Part 1: Basic methods for the measurement
EN 60469:2013 Transitions, pulses and related waveforms - Terms, definitions and algorithms
EN ISO 80000-1:2013 Quantities and units - Part 1: General (ISO 80000-1:2009 + Cor 1:2011)
IEC 60068-1:2013 Environmental testing - Part 1: General and guidance
EN 62884-1:2017 Measurement techniques of piezoelectric, dielectric and electrostatic oscillators - Part 1: Basic methods for the measurement
IEC 60679-4:1997 Quartz crystal controlled oscillators of assessed quality - Part 4: Sectional Specification - Capability approval
IEC 60469:2013 Transitions, pulses and related waveforms - Terms, definitions and algorithms
IEC 61760-1:2006 Surface mounting technology - Part 1: Standard method for the specification of surface mounting components (SMDs)
IEC 60679-5:1998 Quartz crystal controlled oscillators of assessed quality - Part 5: Sectional specification - Qualification approval
ISO 80000-1:2009 Quantities and units — Part 1: General
IEC 60050-561:2014 International Electrotechnical Vocabulary (IEV) - Part 561: Piezoelectric, dielectric and electrostatic devices and associated materials for frequency control, selection and detection
IEC 60068-2-14:2009 Environmental testing - Part 2-14: Tests - Test N: Change of temperature
IEC 60679-1:2017 Piezoelectric, dielectric and electrostatic oscillators of assessed quality - Part 1: Generic specification

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