EN IEC 63041-1:2018
Superseded
A superseded Standard is one, which is fully replaced by another Standard, which is a new edition of the same Standard.
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Piezoelectric sensors - Part 1: Generic specifications
17-11-2021
09-03-2018
FOREWORD
1 Scope
2 Normative references
3 Terms and definitions
4 Symbols of sensor elements
5 Specifications
6 Measurement and detection methods
7 Delivery conditions
8 Quality and reliability
9 Test and measurement procedures
Annex A (normative) - Measurement methods
Annex B (normative) - Detection methods
Bibliography
Annex ZA (normative) - Normative references to international
publications with their corresponding European publications
IEC63041-1:2017(E) applies to piezoelectric sensors of resonator, delay-line and non‑acoustic types, which are used in physical and engineering sciences, chemistry and biochemistry, medical and environmental sciences, etc. The purpose of this document is to specify the terms and definitions for the piezoelectric sensors, and to make sure from a technological perspective that users understand the state‑of-art piezoelectric sensors and how to use them correctly.
| Committee |
CLC/SR 49
|
| DocumentType |
Standard
|
| PublisherName |
European Committee for Standards - Electrical
|
| Status |
Superseded
|
| SupersededBy |
| Standards | Relationship |
| CEI EN IEC 63041-2 : 2018 | Identical |
| NEN-EN-IEC 63041-1:2018 | Identical |
| PN-EN IEC 63041-1: 2018-05 | Identical |
| BS EN IEC 63041-1:2018 | Identical |
| I.S. EN IEC 63041-1:2018 | Identical |
| SN EN IEC 63041-1 : 2018 | Identical |
| SS-EN IEC 63041-1 : 2018 | Identical |
| CEI EN IEC 63041-1 : 2018 | Identical |
| OVE EN IEC 63041-1:2018 | Identical |
| NF EN IEC 63041-1:2018 | Identical |
| UNE-EN IEC 63041-1:2018 | Identical |
| EN ISO 80000-1:2013 | Quantities and units - Part 1: General (ISO 80000-1:2009 + Cor 1:2011) |
| IEC 60444-5:1995 | Measurement of quartz crystal units parameters - Part 5: Methods for the determination of equivalent electrical parameters using automatic network analyzer techniques and error correction |
| IEC 62276:2016 | Single crystal wafers for surface acoustic wave (SAW) device applications - Specifications and measuring methods |
| IEC 61019-1:2004 | Surface acoustic wave (SAW) resonators - Part 1: Generic specification |
| IEC 60862-1:2015 | Surface acoustic wave (SAW) filters of assessed quality - Part 1: Generic specification |
| IEC 60444-9:2007 | Measurement of quartz crystal unit parameters - Part 9: Measurement of spurious resonances of piezoelectric crystal units |
| IEC 61240:2016 | Piezoelectric devices - Preparation of outline drawings of surface-mounted devices (SMD) for frequency control and selection - General rules |
| IEC 60758:2016 | Synthetic quartz crystal - Specifications and guidelines for use |
| EN 60444-9:2007 | Measurement of quartz crystal unit parameters - Part 9: Measurement of spurious resonances of piezoelectric crystal units |
| ISO 80000-1:2009 | Quantities and units — Part 1: General |
| IEC 60050-561:2014 | International Electrotechnical Vocabulary (IEV) - Part 561: Piezoelectric, dielectric and electrostatic devices and associated materials for frequency control, selection and detection |
| IEC 60122-1:2002 | Quartz crystal units of assessed quality - Part 1: Generic specification |
| IEC 60689:2008 | Measurement and test methods for tuning fork quartz crystal units in the range from 10 kHz to 200 kHz and standard values |
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