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  • GEIA SSB 1.002 : 1999

    Current The latest, up-to-date edition.

    ENVIRONMENTAL TESTS AND ASSOCIATED FAILURE MECHANISMS

    Available format(s):  Hardcopy, PDF

    Language(s):  English

    Published date:  01-01-1999

    Publisher:  Government Electronics & Information Technology Association

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    Table of Contents - (Show below) - (Hide below)

    1 Scope
    2 Reference Documents
    3 Environmental Tests and Associated Failure
      Mechanisms

    Abstract - (Show below) - (Hide below)

    Gives reference information concerning the environmental stresses associated with tests specifically designed to apply to (or have unique implications for) plastic encapsulated microcircuits and semiconductors, and the specific failures induced by these environmental stresses.

    General Product Information - (Show below) - (Hide below)

    Committee SSTCG12
    Development Note Annex to GEIA SSB 1. (12/2005)
    Document Type Standard
    Publisher Government Electronics & Information Technology Association
    Status Current

    Standards Referenced By This Book - (Show below) - (Hide below)

    GEIA SSB 1.004 : 2009 FAILURE RATE ESTIMATING
    GEIA SSB 1 : 2000 GUIDELINES FOR USING PLASTIC ENCAPSULATED MICROCIRCUITS AND SEMICONDUCTORS IN MILITARY, AEROSPACE AND OTHER RUGGED APPLICATIONS

    Standards Referencing This Book - (Show below) - (Hide below)

    IPC J STD 033C-1:2014 HANDLING, PACKING, SHIPPING AND USE OF MOISTURE, REFLOW, AND PROCESS SENSITIVE DEVICES
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