I.S. EN 60444-5:1999
Current
The latest, up-to-date edition.
MEASUREMENT OF QUARTZ CRYSTAL UNIT PARAMETERS BY ZERO PHASE TECHNIQUE IN A PI-NETWORK - METHODS FOR THE DETERMINATION OF EQUIVALENT ELECTRICAL PARAMETERS USING AUTOMATIC NETWORK ANALYZER TECHNIQUES AND ERROR CORRECTION
12-01-2013
For Harmonized Standards, check the EU site to confirm that the Standard is cited in the Official Journal.
Only cited Standards give presumption of conformance to New Approach Directives/Regulations.
Dates of withdrawal of national standards are available from NSAI.
Committees responsible
National foreword
Methods
1 Scope
2 Introduction
3 Measurement procedures
4 Choice of admittance measurement method
5 Calibration techniques
6 Low-frequency measurements
7 Admittance analysis and estimation of the equivalent
circuit parameters
8 Measurement errors, instrumentation and test fixtures
Annexes
A (normative) Calibration
B (informative) Low-frequency measurement
C (informative) Bibliography
Figures
1 Measurement sequence
2 Measurement methods, admittance analysis and parameter
estimation techniques
3 One-port equivalent circuit of a single-mode quartz
crystal unit
4 Two-port equivalent circuit of a single-mode quartz
crystal unit
5 Admittance and impedance circle of a quartz crystal
unit for frequencies near an isolated mode of vibration
6 General one-port equivalent circuit for multiple
resonance
7 Two-port equivalent circuit for multiple resonances
8 Procedure for the determination of the equivalent
circuit parameters of a quartz crystal unit
9 Calibration verification for S-parameter measurement
10 APC-3.5 Transmission fixture
11 APC-7 Transmission fixture
12 APC-7 Reflection fixture
13 APC-3.5 One-port fixture
14 APC 3.5 Two-port fixture
15 Direct transmission measurement fixture
A.1 Simplified one-port network analyzer
A.2 Simplified two-port, three-channel network analyzer
A.3 Signal flowgraph representation for proposed
12-term error model
A.4 Typical direct transmission system
A.5 Equivalent circuit for direct transmission method
A.6 Thin-film calibration resistor
A.7 Modified SMA terminating resistor
B.1 Simplified network analyzer test system for
low-frequency measurements
B.2 1 : 2 Directional bridge for low-frequency
measurements
B.3 1 : 1 Directional bridge for low-frequency
measurements
Annex ZA (normative) Normative references to international
publications with their corresponding European publications
Covers methods for determining the best representations of modes in quartz crystal resonators by linear equivalent circuits.
| DevelopmentNote |
For CENELEC adoptions of IEC publications, please check www.iec.ch to be sure that you have any corrigenda that may apply. (01/2017)
|
| DocumentType |
Standard
|
| PublisherName |
National Standards Authority of Ireland
|
| Status |
Current
|
| Standards | Relationship |
| EN 60444-5:1997 | Identical |
| IEC 60444-5:1995 | Identical |
| DIN EN 60444-5:1997-10 | Identical |
| NBN EN 60444-5 : 1997 | Identical |
| BS EN 60444-5:1997 | Identical |
| NF EN 60444-5 : 2001 | Identical |
| SN EN 60444-5 : 1997 | Identical |
Access your standards online with a subscription
Features
-
Simple online access to standards, technical information and regulations.
-
Critical updates of standards and customisable alerts and notifications.
-
Multi-user online standards collection: secure, flexible and cost effective.