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I.S. EN 60747-5-3:2001

Current

Current

The latest, up-to-date edition.

DISCRETE SEMICONDUCTOR DEVICES AND INTEGRATED CIRCUITS - PART 5-3: OPTOELECTRONIC DEVICES - MEASURING METHODS

Available format(s)

Hardcopy , PDF

Language(s)

English

Published date

01-01-2001

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Foreword
1 Scope
2 Normative references
3 Measuring methods for photoemitters
  3.1 Luminous intensity of light-emitting diodes (I[v])
  3.2 Radiant intensity of infrared-emitting diodes (I[e])
  3.3 Peak-emission wavelength (lambda[p]), spectral
       radiation bandwidth (deltalambda), and number of
       longitudinal modes (n[m])
  3.4 Emission source length and width and astigmatism
       of a laser diode without pigtail
  3.5 Half-intensity angle and misalignment angle of
       a photoemitter
4 Measuring methods for photosensitive devices
  4.1 Reverse current under optical radiation of
       photodiodes including devices with or without
       pigtails (I[R(H)] or I[R(E)]), and collector
       current under optical radiation of phototransistors
       (I[C(H)] or I[C(E)])
  4.2 Dark current for photodiodes I[R] and dark currents
       for phototransistors I[CEO], I[ECO], I[EBO]
  4.3 Collector-emitter saturation voltage V[CE(sat)] of
       phototransistors
5 Measuring methods for photocouplers
  5.1 Current transfer ratio (h[F(ctr)])
  5.2 Input-to-output capacitance (C[io])
  5.3 Isolation resistance between input and output
       (r[IO])
  5.4 Isolation test
  5.5 Partial discharges of photocouplers
  5.6 Collector-emitter saturation voltage V[CE(sat)] of
       a photocoupler
  5.7 Switching times t[on], t[off] of a photocoupler
  5.8 Peak off-state current (I[DRM])
  5.9 Peak on-state voltage (V[TM])
  5.10 DC off-state current (I[BD])
  5.11 DC on-state voltage (V[T])
  5.12 Holding current (I[H])
  5.13 Critical rate of rise of off-state voltage (dV/dt)
  5.14 Trigger input current (I[FT])
  5.15 Testing methods of electrical rating for
       phototriac coupler
Annex A (informative) Cross references index

Specifies the measuring methods applicable to the optoelectronic devices which are not intended to be used in the fibre optic systems or subsystems.

DevelopmentNote
For CENELEC adoptions of IEC publications, please check www.iec.ch to be sure that you have any corrigenda that may apply. (01/2017) 2001 Edition is Partially Superseded by I.S. EN 60747-5-5. (07/2017)
DocumentType
Standard
Pages
110
PublisherName
National Standards Authority of Ireland
Status
Current

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