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I.S. EN 60749-14:2003

Current

Current

The latest, up-to-date edition.

SEMICONDUCTOR DEVICES - MECHANICAL AND CLIMATIC TEST METHODS - PART 14: ROBUSTNESS OF TERMINATIONS (LEAD INTEGRITY)

Available format(s)

Hardcopy , PDF

Language(s)

English

Published date

01-01-2003

For Harmonized Standards, check the EU site to confirm that the Standard is cited in the Official Journal.

Only cited Standards give presumption of conformance to New Approach Directives/Regulations.


Dates of withdrawal of national standards are available from NSAI.

FOREWORD
1 Scope
2 Normative references
3 General
4 Test condition A - Tension
5 Test condition B - Bending stress
6 Test condition C - Lead fatigue
7 Test condition D - Lead torque
8 Test condition E - Stud torque

Provides various tests for determining the integrity between the lead/package interface and the lead itself when the lead(s) are bent due to faulty board assembly followed by rework of the part for re-assembly. Applicable to all through-hole devices and surface-mount devices requiring lead forming by the user.

DevelopmentNote
For CENELEC adoptions of IEC publications, please check www.iec.ch to be sure that you have any corrigenda that may apply. (01/2017)
DocumentType
Standard
Pages
42
PublisherName
National Standards Authority of Ireland
Status
Current

Standards Relationship
UNE-EN 60749-14:2004 Identical
IEC 60749-14:2003 Identical
BS EN 60749-14:2003 Identical
NBN EN 60749-14 : 2004 Identical
DIN EN 60749-14:2004-07 Identical
EN 60749-14:2003 Identical
NF EN 60749-14 : 2004 Identical

IEC 60749-8:2002 Semiconductor devices - Mechanical and climatic test methods - Part 8: Sealing
EN 60749-8:2003 Semiconductor devices - Mechanical and climatic test methods - Part 8: Sealing

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