I.S. EN 60749-15:2010
Superseded
A superseded Standard is one, which is fully replaced by another Standard, which is a new edition of the same Standard.
View Superseded by
SEMICONDUCTOR DEVICES - MECHANICAL AND CLIMATIC TEST METHODS - PART 15: RESISTANCE TO SOLDERING TEMPERATURE FOR THROUGH-HOLE MOUNTED DEVICES
Hardcopy , PDF
30-10-2020
English
01-01-2010
For Harmonized Standards, check the EU site to confirm that the Standard is cited in the Official Journal.
Only cited Standards give presumption of conformance to New Approach Directives/Regulations.
Dates of withdrawal of national standards are available from NSAI.
FOREWORD
1 Scope
2 General
3 Test apparatus
4 Materials
5 Procedure
6 Summary
Bibliography
Provides a test used to determine whether encapsulated solid state devices used for through-hole mounting can withstand the effects of the temperature to which they are subjected during soldering of their leads by using wave soldering or a soldering iron.
DevelopmentNote |
For CENELEC adoptions of IEC publications, please check www.iec.ch to be sure that you have any corrigenda that may apply. (01/2017)
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DocumentType |
Standard
|
Pages |
13
|
PublisherName |
National Standards Authority of Ireland
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Status |
Superseded
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SupersededBy | |
Supersedes |
Standards | Relationship |
UNE-EN 60749-15:2011 | Identical |
NF EN 60749-15 : 2011 | Identical |
IEC 60749-15:2010 | Identical |
SN EN 60749-15 : 2003 | Identical |
BS EN 60749-15:2010 | Identical |
DIN EN 60749-15:2011-06 | Identical |
EN 60749-15:2010/AC:2011 | Identical |
NBN EN 60749-15 : 2011 | Identical |
IEC 60068-2-20:2008 | Environmental testing - Part 2-20: Tests - Test T: Test methods for solderability and resistance to soldering heat of devices with leads |
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