I.S. EN 60749-28:2017
Superseded
A superseded Standard is one, which is fully replaced by another Standard, which is a new edition of the same Standard.
View Superseded by
SEMICONDUCTOR DEVICES - MECHANICAL AND CLIMATIC TEST METHODS - PART 28: ELECTROSTATIC DISCHARGE (ESD) SENSITIVITY TESTING - CHARGED DEVICE MODEL (CDM) - DEVICE LEVEL
Hardcopy , PDF
06-06-2022
English
01-01-2017
For Harmonized Standards, check the EU site to confirm that the Standard is cited in the Official Journal.
Only cited Standards give presumption of conformance to New Approach Directives/Regulations.
Dates of withdrawal of national standards are available from NSAI.
National Foreword
FOREWORD
INTRODUCTION
1 Scope
2 Normative references
3 Terms and definitions
4 Required equipment
5 Periodic tester qualification, waveform records, and
waveform verification requirements
6 CDM ESD testing requirements and procedures
7 CDM classification criteria
Annex A (normative) - Verification module (metal disc)
specifications and cleaning guidelines for verification
modules and testers
Annex B (normative) - Capacitance measurement of verification
modules (metal discs) sitting on a tester field plate
dielectric
Annex C (informative) - CDM test hardware and metrology
improvements
Annex D (informative) - CDM tester electrical schematic
Annex E (informative) - Sample oscilloscope setup and waveform
Annex F (informative) - Field-induced CDM tester discharge
procedures
Annex G (informative) - Waveform verification procedures
Annex H (informative) - Determining the appropriate charge delay
for full charging of a large module or device
Annex I (informative) - Electrostatic discharge (ESD) sensitivity
testing direct contact charged device model (DC-CDM)
Bibliography
Defines the procedure for testing, evaluating, and classifying devices and microcircuits according to their susceptibility (sensitivity) to damage or degradation by exposure to a defined field-induced charged device model (CDM) electrostatic discharge (ESD).
| DevelopmentNote |
For CENELEC adoptions of IEC publications, please check www.iec.ch to be sure that you have any corrigenda that may apply. (07/2017)
|
| DocumentType |
Standard
|
| Pages |
56
|
| PublisherName |
National Standards Authority of Ireland
|
| Status |
Superseded
|
| SupersededBy |
| Standards | Relationship |
| EN 60749-28:2017 | Identical |
| IEC 60749-26:2013 | Semiconductor devices - Mechanical and climatic test methods - Part 26: Electrostatic discharge (ESD) sensitivity testing - Human body model (HBM) |
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