• I.S. EN 60749-28:2017

    Superseded A superseded Standard is one, which is fully replaced by another Standard, which is a new edition of the same Standard.

    SEMICONDUCTOR DEVICES - MECHANICAL AND CLIMATIC TEST METHODS - PART 28: ELECTROSTATIC DISCHARGE (ESD) SENSITIVITY TESTING - CHARGED DEVICE MODEL (CDM) - DEVICE LEVEL

    Available format(s):  Hardcopy, PDF

    Superseded date:  05-06-2022

    Language(s):  English

    Published date:  31-12-2016

    Publisher:  National Standards Authority of Ireland

    For Harmonized Standards, check the EU site to confirm that the Standard is cited in the Official Journal.
    Only cited Standards give presumption of conformance to New Approach Directives/Regulations.

    Dates of withdrawal of national standards are available from NSAI.

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    Table of Contents - (Show below) - (Hide below)

    National Foreword
    FOREWORD
    INTRODUCTION
    1 Scope
    2 Normative references
    3 Terms and definitions
    4 Required equipment
    5 Periodic tester qualification, waveform records, and
      waveform verification requirements
    6 CDM ESD testing requirements and procedures
    7 CDM classification criteria
    Annex A (normative) - Verification module (metal disc)
            specifications and cleaning guidelines for verification
            modules and testers
    Annex B (normative) - Capacitance measurement of verification
            modules (metal discs) sitting on a tester field plate
            dielectric
    Annex C (informative) - CDM test hardware and metrology
            improvements
    Annex D (informative) - CDM tester electrical schematic
    Annex E (informative) - Sample oscilloscope setup and waveform
    Annex F (informative) - Field-induced CDM tester discharge
            procedures
    Annex G (informative) - Waveform verification procedures
    Annex H (informative) - Determining the appropriate charge delay
            for full charging of a large module or device
    Annex I (informative) - Electrostatic discharge (ESD) sensitivity
            testing direct contact charged device model (DC-CDM)
    Bibliography

    Abstract - (Show below) - (Hide below)

    Defines the procedure for testing, evaluating, and classifying devices and microcircuits according to their susceptibility (sensitivity) to damage or degradation by exposure to a defined field-induced charged device model (CDM) electrostatic discharge (ESD).

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    Development Note For CENELEC adoptions of IEC publications, please check www.iec.ch to be sure that you have any corrigenda that may apply. (07/2017)
    Document Type Standard
    Publisher National Standards Authority of Ireland
    Status Superseded
    Superseded By

    Standards Referencing This Book - (Show below) - (Hide below)

    IEC 60749-26:2013 Semiconductor devices - Mechanical and climatic test methods - Part 26: Electrostatic discharge (ESD) sensitivity testing - Human body model (HBM)
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