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I.S. EN 60749-36:2003

Current

Current

The latest, up-to-date edition.

SEMICONDUCTOR DEVICES - MECHANICAL AND CLIMATIC TEST METHODS - PART 36: ACCELERATION, STEADY STATE

Available format(s)

Hardcopy , PDF

Language(s)

English

Published date

01-01-2003

For Harmonized Standards, check the EU site to confirm that the Standard is cited in the Official Journal.

Only cited Standards give presumption of conformance to New Approach Directives/Regulations.


Dates of withdrawal of national standards are available from NSAI.

Foreword
1 Scope
2 Normative references
3 Test apparatus
4 Procedure
5 Summary

Provides a test for determining the effects of constant acceleration on cavity-type semiconductor devices.

DevelopmentNote
For CENELEC adoptions of IEC publications, please check www.iec.ch to be sure that you have any corrigenda that may apply. (01/2017)
DocumentType
Standard
Pages
21
PublisherName
National Standards Authority of Ireland
Status
Current

Standards Relationship
SN EN 60749-36 : 2003 Identical
NF EN 60749-36 : 2003 Identical
IEC 60749-36:2003 Identical
DIN EN 60749-36:2003-12 Identical
NBN EN 60749-36 : 2004 Identical
BS EN 60749-36:2003 Identical
EN 60749-36:2003 Identical
UNE-EN 60749-36:2004 Identical

EN 60068-2-7:1993 Environmental testing - Part 2: Tests - Test Ga: Acceleration, steady state

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