I.S. EN 60749-4:2017
Current
The latest, up-to-date edition.
SEMICONDUCTOR DEVICES - MECHANICAL AND CLIMATIC TEST METHODS - PART 4: DAMP HEAT, STEADY STATE, HIGHLY ACCELERATED STRESS TEST (HAST)
Hardcopy , PDF
English
01-01-2017
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National Foreword
FOREWORD
1 Scope
2 Normative references
3 Terms and definitions
4 HAST test General remarks
5 Test apparatus
6 Test conditions
7 Procedure
8 Failure criteria
9 Safety
10 Summary
Annex ZA (normative) - Normative references to
international publications with their
corresponding European publications
Gives a highly accelerated temperature and humidity stress test (HAST) for the purpose of evaluating the reliability of non-hermetic packaged semiconductor devices in humid environments.
| DevelopmentNote |
For CENELEC adoptions of IEC publications, please check www.iec.ch to be sure that you have any corrigenda that may apply. (01/2017)
|
| DocumentType |
Standard
|
| Pages |
24
|
| PublisherName |
National Standards Authority of Ireland
|
| Status |
Current
|
| Standards | Relationship |
| UNE-EN 60749-4:2003 | Identical |
| NBN EN 60749-4 : 2003 | Identical |
| DIN EN 60749-4:2016-06 (Draft) | Identical |
| NF EN 60749-4 : 2002 | Identical |
| EN 60749-4:2017 | Identical |
| BS EN 60749-4:2002 | Identical |
| BS EN 60749-4:2017 | Identical |
| IEC 60749-5:2017 | Semiconductor devices - Mechanical and climatic test methods - Part 5: Steady-state temperature humidity bias life test |
| EN 60749-5:2017 | Semiconductor devices - Mechanical and climatic test methods - Part 5: Steady-state temperature humidity bias life test |
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