I.S. EN 61338-1-5:2015
Current
The latest, up-to-date edition.
WAVEGUIDE TYPE DIELECTRIC RESONATORS - PART 1-5: GENERAL INFORMATION AND TEST CONDITIONS - MEASUREMENT METHOD OF CONDUCTIVITY AT INTERFACE BETWEEN CONDUCTOR LAYER AND DIELECTRIC SUBSTRATE AT MICROWAVE FREQUENCY
Hardcopy , PDF
English
01-01-2015
For Harmonized Standards, check the EU site to confirm that the Standard is cited in the Official Journal.
Only cited Standards give presumption of conformance to New Approach Directives/Regulations.
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National Foreword
FOREWORD
INTRODUCTION
1 Scope
2 Normative references
3 Measurement and related parameters
4 Calculation equations for R[i] and sigma[i]
5 Preparation of specimen
6 Measurement equipment and apparatus
7 Measurement procedure
8 Example of measurement result
Annex A (informative) - Derivation of Equation (4) for Ri
Annex B (informative) - Calculation uncertainty of
parameters in Figure 3
Bibliography
Annex ZA (normative) - Normative references to
international publications with their
corresponding European publications
Explains a measurement method for resistance and effective conductivity at the interface between conductor layer and dielectric substrate, which are called interface resistance and interface conductivity.
DevelopmentNote |
For CENELEC adoptions of IEC publications, please check www.iec.ch to be sure that you have any corrigenda that may apply. (01/2017)
|
DocumentType |
Standard
|
Pages |
54
|
PublisherName |
National Standards Authority of Ireland
|
Status |
Current
|
Standards | Relationship |
EN 61338-1-5:2015 | Identical |
EN 61338-1-3:2000 | Waveguide type dielectric resonators - Part 1-3: General information and test conditions - Measurement method of complex relative permittivity for dielectric resonator materials at microwave frequency |
EN 62252:2004 | Maritime navigation and radiocommunication equipment and systems - Radar for craft not in compliance with IMO SOLAS Chapter V - Performance requirements, methods of test and required test results |
IEC 62562:2010 | Cavity resonator method to measure the complex permittivity of low-loss dielectric plates |
IEC 61338-1-3:1999 | Waveguide type dielectric resonators - Part 1-3: General information and test conditions - Measurement method of complex relative permittivity for dielectric resonator materials at microwave frequency |
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