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I.S. EN 62433-2:2017

Current

Current

The latest, up-to-date edition.

EMC IC MODELLING - PART 2: MODELS OF INTEGRATED CIRCUITS FOR EMI BEHAVIOURAL SIMULATION - CONDUCTED EMISSIONS MODELLING (ICEM-CE)

Available format(s)

Hardcopy , PDF

Language(s)

English

Published date

01-01-2017

For Harmonized Standards, check the EU site to confirm that the Standard is cited in the Official Journal.

Only cited Standards give presumption of conformance to New Approach Directives/Regulations.


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€129.00
Excluding VAT

National Foreword
FOREWORD
1 Scope
2 Normative references
3 Terms, definitions, abbreviations and conventions
4 Philosophy
5 ICEM-CE basic components
6 IC macro-models
7 CEML format
8 Requirements for parameter extraction
Annex A (normative) - Preliminary definitions for
        XML representation
Annex B (normative) - CEML valid keywords and usage
Annex C (informative) - Example of ICEM-CE
        macro-model in CEML format
Annex D (informative) - Conversions between parameter
        types
Annex E (informative) - Model parameter generation
Annex F (informative) - Decoupling capacitors optimization
Annex G (informative) - Conducted emission prediction
Annex H (informative) - Conducted emission prediction
        at PCB level
Bibliography
Annex ZA (normative) - Normative references to
         international publications with their
         corresponding European publications

Defines macro-models for an Integrated Circuit (IC) to simulate conducted electromagnetic emissions on a printed circuit board.

DevelopmentNote
For CENELEC adoptions of IEC publications, please check www.iec.ch to be sure that you have any corrigenda that may apply. (01/2017)
DocumentType
Standard
Pages
232
PublisherName
National Standards Authority of Ireland
Status
Current

Standards Relationship
EN 62433-2:2017 Identical

IEC 61967-4:2002+AMD1:2006 CSV Integrated circuits - Measurement of electromagnetic emissions, 150 kHz to 1 GHz - Part 4: Measurement of conducted emissions - 1 Ω/150 Ω direct coupling method
ISO 8879:1986 Information processing Text and office systems Standard Generalized Markup Language (SGML)
CISPR 17:2011 Methods of measurement of the suppression characteristics of passive EMC filtering devices
IEC TS 62433-1:2011 EMC IC modelling - Part 1: General modelling framework
EN 55017 : 2011 METHODS OF MEASUREMENT OF THE SUPPRESSION CHARACTERISTICS OF PASSIVE EMC FILTERING DEVICES (CISPR 17:2011)

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