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I.S. EN 62433-2:2017

I.S. EN 62433-2:2017

Current

Current

The latest, up-to-date edition.

EMC IC MODELLING - PART 2: MODELS OF INTEGRATED CIRCUITS FOR EMI BEHAVIOURAL SIMULATION - CONDUCTED EMISSIONS MODELLING (ICEM-CE)

Available format(s)

Hardcopy , PDF

Language(s)

English

Published date

01-01-2017

Publisher

National Standards Authority of Ireland

Preview

For Harmonized Standards, check the EU site to confirm that the Standard is cited in the Official Journal.

Only cited Standards give presumption of conformance to New Approach Directives/Regulations.


Dates of withdrawal of national standards are available from NSAI.

National Foreword
FOREWORD
1 Scope
2 Normative references
3 Terms, definitions, abbreviations and conventions
4 Philosophy
5 ICEM-CE basic components
6 IC macro-models
7 CEML format
8 Requirements for parameter extraction
Annex A (normative) - Preliminary definitions for
        XML representation
Annex B (normative) - CEML valid keywords and usage
Annex C (informative) - Example of ICEM-CE
        macro-model in CEML format
Annex D (informative) - Conversions between parameter
        types
Annex E (informative) - Model parameter generation
Annex F (informative) - Decoupling capacitors optimization
Annex G (informative) - Conducted emission prediction
Annex H (informative) - Conducted emission prediction
        at PCB level
Bibliography
Annex ZA (normative) - Normative references to
         international publications with their
         corresponding European publications

Defines macro-models for an Integrated Circuit (IC) to simulate conducted electromagnetic emissions on a printed circuit board.

DevelopmentNote
For CENELEC adoptions of IEC publications, please check www.iec.ch to be sure that you have any corrigenda that may apply. (01/2017)
DocumentType
Standard
Pages
232
PublisherName
National Standards Authority of Ireland
Status
Current

Standards Relationship
EN 62433-2:2017 Identical

IEC 61967-4:2002+AMD1:2006 CSV Integrated circuits - Measurement of electromagnetic emissions, 150 kHz to 1 GHz - Part 4: Measurement of conducted emissions - 1 Ω/150 Ω direct coupling method
ISO 8879:1986 Information processing Text and office systems Standard Generalized Markup Language (SGML)
CISPR 17:2011 Methods of measurement of the suppression characteristics of passive EMC filtering devices
IEC TS 62433-1:2011 EMC IC modelling - Part 1: General modelling framework
EN 55017 : 2011 METHODS OF MEASUREMENT OF THE SUPPRESSION CHARACTERISTICS OF PASSIVE EMC FILTERING DEVICES (CISPR 17:2011)

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Hardcopy - English
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