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    I.S. EN 62433-2:2017

    Current The latest, up-to-date edition.

    EMC IC MODELLING - PART 2: MODELS OF INTEGRATED CIRCUITS FOR EMI BEHAVIOURAL SIMULATION - CONDUCTED EMISSIONS MODELLING (ICEM-CE)

    Available format(s):  Hardcopy, PDF

    Language(s):  English

    Published date:  01-01-2017

    Publisher:  National Standards Authority of Ireland

    For Harmonized Standards, check the EU site to confirm that the Standard is cited in the Official Journal.
    Only cited Standards give presumption of conformance to New Approach Directives/Regulations.

    Dates of withdrawal of national standards are available from NSAI.

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    Table of Contents - (Show below) - (Hide below)

    National Foreword
    FOREWORD
    1 Scope
    2 Normative references
    3 Terms, definitions, abbreviations and conventions
    4 Philosophy
    5 ICEM-CE basic components
    6 IC macro-models
    7 CEML format
    8 Requirements for parameter extraction
    Annex A (normative) - Preliminary definitions for
            XML representation
    Annex B (normative) - CEML valid keywords and usage
    Annex C (informative) - Example of ICEM-CE
            macro-model in CEML format
    Annex D (informative) - Conversions between parameter
            types
    Annex E (informative) - Model parameter generation
    Annex F (informative) - Decoupling capacitors optimization
    Annex G (informative) - Conducted emission prediction
    Annex H (informative) - Conducted emission prediction
            at PCB level
    Bibliography
    Annex ZA (normative) - Normative references to
             international publications with their
             corresponding European publications

    Abstract - (Show below) - (Hide below)

    Defines macro-models for an Integrated Circuit (IC) to simulate conducted electromagnetic emissions on a printed circuit board.

    General Product Information - (Show below) - (Hide below)

    Development Note For CENELEC adoptions of IEC publications, please check www.iec.ch to be sure that you have any corrigenda that may apply. (01/2017)
    Document Type Standard
    Publisher National Standards Authority of Ireland
    Status Current

    Standards Referencing This Book - (Show below) - (Hide below)

    IEC 61967-4:2002+AMD1:2006 CSV Integrated circuits - Measurement of electromagnetic emissions, 150 kHz to 1 GHz - Part 4: Measurement of conducted emissions - 1 Ω/150 Ω direct coupling method
    ISO 8879:1986 Information processing Text and office systems Standard Generalized Markup Language (SGML)
    CISPR 17:2011 Methods of measurement of the suppression characteristics of passive EMC filtering devices
    IEC TS 62433-1:2011 EMC IC modelling - Part 1: General modelling framework
    EN 55017 : 2011 METHODS OF MEASUREMENT OF THE SUPPRESSION CHARACTERISTICS OF PASSIVE EMC FILTERING DEVICES (CISPR 17:2011)
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