I.S. EN IEC 63041-1:2018
Superseded
A superseded Standard is one, which is fully replaced by another Standard, which is a new edition of the same Standard.
View Superseded by
PIEZOELECTRIC SENSORS - PART 1: GENERIC SPECIFICATIONS
Hardcopy , PDF
17-11-2021
English
10-04-2018
For Harmonized Standards, check the EU site to confirm that the Standard is cited in the Official Journal.
Only cited Standards give presumption of conformance to New Approach Directives/Regulations.
Dates of withdrawal of national standards are available from NSAI.
Important note : Users cannot be edited or removed once added to your Multi user PDF.
National Foreword
FOREWORD
1 Scope
2 Normative references
3 Terms and definitions
4 Symbols of sensor elements
5 Specifications
6 Measurement and detection methods
7 Delivery conditions
8 Quality and reliability
9 Test and measurement procedures
Annex A (normative) - Measurement methods
Annex B (normative) - Detection methods
Bibliography
Annex ZA (normative) - Normative references to international
publications with their corresponding European publications
Pertains to piezoelectric sensors of resonator, delay-line and non acoustic types, which are used in physical and engineering sciences, chemistry and biochemistry, medical and environmental sciences, etc.
| DevelopmentNote |
For CENELEC adoptions of IEC publications, please check www.iec.ch to be sure that you have any corrigenda that may apply. (04/2018)
|
| DocumentType |
Standard
|
| Pages |
0
|
| PublisherName |
National Standards Authority of Ireland
|
| Status |
Superseded
|
| SupersededBy |
| Standards | Relationship |
| EN IEC 63041-1:2018 | Identical |
| EN ISO 80000-1:2013 | Quantities and units - Part 1: General (ISO 80000-1:2009 + Cor 1:2011) |
| IEC 60444-5:1995 | Measurement of quartz crystal units parameters - Part 5: Methods for the determination of equivalent electrical parameters using automatic network analyzer techniques and error correction |
| IEC 62276:2016 | Single crystal wafers for surface acoustic wave (SAW) device applications - Specifications and measuring methods |
| IEC 61019-1:2004 | Surface acoustic wave (SAW) resonators - Part 1: Generic specification |
| IEC 60862-1:2015 | Surface acoustic wave (SAW) filters of assessed quality - Part 1: Generic specification |
| IEC 60444-9:2007 | Measurement of quartz crystal unit parameters - Part 9: Measurement of spurious resonances of piezoelectric crystal units |
| IEC 61240:2016 | Piezoelectric devices - Preparation of outline drawings of surface-mounted devices (SMD) for frequency control and selection - General rules |
| IEC 60758:2016 | Synthetic quartz crystal - Specifications and guidelines for use |
| EN 60444-9:2007 | Measurement of quartz crystal unit parameters - Part 9: Measurement of spurious resonances of piezoelectric crystal units |
| ISO 80000-1:2009 | Quantities and units — Part 1: General |
| IEC 60050-561:2014 | International Electrotechnical Vocabulary (IEV) - Part 561: Piezoelectric, dielectric and electrostatic devices and associated materials for frequency control, selection and detection |
| IEC 60122-1:2002 | Quartz crystal units of assessed quality - Part 1: Generic specification |
| IEC 60689:2008 | Measurement and test methods for tuning fork quartz crystal units in the range from 10 kHz to 200 kHz and standard values |
Access your standards online with a subscription
Features
-
Simple online access to standards, technical information and regulations.
-
Critical updates of standards and customisable alerts and notifications.
-
Multi-user online standards collection: secure, flexible and cost effective.