IEC 60747-11:1985

FOREWORD
PREFACE
Clause
1 Scope
2 General
  2.1 Related documents
  2.2 Recommended values of temperatures (preferred
      values)
  2.3 Recommended values of voltages and currents
      (preferred values)
  2.4 Terminal identification
  2.5 Colour codes for type designation
      2.5.1 For JEDEC type numbers
      2.5.2 For PRO ELECTRON type numbers
      2.5.3 Any other type numbers
3 Quality assessment procedures
  3.1 Primary stage of manufacture
  3.2 Structurally similar devices
      3.2.1 Grouping for electrical tests
      3.2.2 Grouping for dimensional, climatic and
            mechanical inspections or tests
      3.2.3 Grouping for endurance tests
  3.3 Inspection requirements for qualification approval
  3.4 Quality conformance inspection
      3.4.1 Division into groups and sub-groups
            Table I - Group A: Lot by lot
            Table II - Group B: Lot by lot
            Table III - Group C: Periodic
  3.5 Group D tests
  3.6 Screening
      Table IV - Screening
  3.7 Sampling requirements
      Table V - Sampling requirements for Group A tests
      Table VI - Sampling requirements for Groups B and C
                 tests, in which LTPD shall be used
4 Test and measurement procedures

Applies to discrete semiconductor devices, excluding optoelectronicdevices. Should be read together with the generic specification towhich it refers: it gives details of the Quality AssessmentProcedures, the inspection requirements, screening sequences,sampling requirements, test and measurement procedures required forthe assessment of semiconductor devices.