IEC 60747-2-2:1993
Superseded
A superseded Standard is one, which is fully replaced by another Standard, which is a new edition of the same Standard.
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Semiconductor devices - Discrete devices - Part 2: Rectifier diodes - Section 2: Blank detail specification for rectifier diodes (including avalanche rectifier diodes), ambient and case-rated, for currents greater than 100 A
Hardcopy , PDF , PDF 3 Users , PDF 5 Users , PDF 9 Users
13-04-2016
English - French
08-10-1993
Important note : Users cannot be edited or removed once added to your Multi user PDF.
FOREWORD
INTRODUCTION
1 Mechanical description
2 Short description
3 Categories of assessed quality
4 Limiting values (absolute maximum rating system)
common to all applications
5 Electrical characteristics
6 Marking
7 Ordering information
8 Test conditions and inspection requirements
9 Group D - Qualification approval tests
10 Additional information (not for inspection purposes)
This publication also bears a QC number. This number, QC 750109, is the specification number in the IEC Quality Assessment System for Electronic Components (IECQ).
| DevelopmentNote |
Also numbered as BS QC750109(1993) (08/2005) Stability Date: 2013. (10/2012)
|
| DocumentType |
Standard
|
| Pages |
31
|
| PublisherName |
International Electrotechnical Committee
|
| Status |
Superseded
|
| SupersededBy |
| Standards | Relationship |
| PN IEC 60747-2-2 : 2000 | Identical |
| SAC GB/T 16894 : 1997 | Identical |
| IEC 61747-1:1998+AMD1:2003 CSV | Liquid crystal and solid-state display devices - Part 1: Generic specification |
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