IEC 60747-5-4:2006
Superseded
A superseded Standard is one, which is fully replaced by another Standard, which is a new edition of the same Standard.
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Semiconductor devices - Discrete devices - Part 5-4: Optoelectronic devices - Semiconductor lasers
Hardcopy , PDF , PDF 3 Users , PDF 5 Users , PDF 9 Users
27-04-2022
English - French
23-02-2006
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FOREWORD
1 Scope
2 Normative references
3 General
3.1 Physical concepts
3.3 General terms
3.4 Terms related to ratings and characteristics
4 Essential rating and characteristics
4.1 Type
4.2 Semiconductor
4.3 Details of outline drawing and encapsulation
4.4 Limiting values (absolute maximum ratings)
4.5 Electrical and optical characteristics
4.6 Supplementary information - Temperature dependence of
wavelength
5 Measurement methods
5.1 Power measurement
5.2 Output power stability
5.3 Time domain profile
5.4 Lifetime
5.5 Optical characteristics of the laser beam
Annex A (informative) Reference list of technical terms and
definitions related to spatial profile
and spectral characteristics
Annex B (informative) Reference list of measurement methods
related to spatial profile and spectral
characteristics
Annex C (informative) Reference list of technical terms and
definitions, and measurement methods,
related to power measurement and lifetime
Bibliography
Figures
Table
Deals with the terminology, the essential ratings and characteristics as well as the measuring methods of semiconductor lasers.
| Committee |
TC 47/SC 47E
|
| DevelopmentNote |
To be read in conjunction with IEC 62007-1 and IEC 62007-2. (02/2006) Supersedes IEC 60747-5-1, IEC 60747-5-2 and IEC 60747-5-3. (02/2016) Stability Date: 2018. (09/2017)
|
| DocumentType |
Standard
|
| Pages |
59
|
| PublisherName |
International Electrotechnical Committee
|
| Status |
Superseded
|
| SupersededBy | |
| Supersedes |
| Standards | Relationship |
| NEN IEC 60747-5-4 : 2006 | Identical |
| BS IEC 60747-5-4:2006 | Identical |
| JIS C 5942:2010 | Identical |
| IEC 60747-5-7:2016 | Semiconductor devices - Part 5-7: Optoelectronic devices - Photodiodes and phototransistors |
| IEC 60270:2000+AMD1:2015 CSV | High-voltage test techniques - Partial discharge measurements |
| ISO 11554:2017 | Optics and photonics — Lasers and laser-related equipment — Test methods for laser beam power, energy and temporal characteristics |
| IEC 60050-731:1991 | International Electrotechnical Vocabulary (IEV) - Part 731: Optical fibre communication |
| IEC 60068-1:2013 | Environmental testing - Part 1: General and guidance |
| IEC 62007-1:2015 | Semiconductor optoelectronic devices for fibre optic system applications - Part 1: Specification template for essential ratings and characteristics |
| ISO 11146-1:2005 | Lasers and laser-related equipment Test methods for laser beam widths, divergence angles and beam propagation ratios Part 1: Stigmatic and simple astigmatic beams |
| ISO 13694:2015 | Optics and photonics Lasers and laser-related equipment Test methods for laser beam power (energy) density distribution |
| ISO 11146-2:2005 | Lasers and laser-related equipment Test methods for laser beam widths, divergence angles and beam propagation ratios Part 2: General astigmatic beams |
| IEC 60050-845:1987 | International Electrotechnical Vocabulary (IEV) - Part 845: Lighting |
| IEC 60825-1:2014 | Safety of laser products - Part 1: Equipment classification and requirements |
| ISO 11670:2003 | Lasers and laser-related equipment — Test methods for laser beam parameters — Beam positional stability |
| IEC 62007-2:2009 | Semiconductor optoelectronic devices for fibre optic system applications - Part 2: Measuring methods |
| IEC 60306-1:1969 | Measurement of photosensitive devices - Part 1: Basic recommendations |
| ISO 15367-1:2003 | Lasers and laser-related equipment Test methods for determination of the shape of a laser beam wavefront Part 1: Terminology and fundamental aspects |
| ISO 13695:2004 | Optics and photonics — Lasers and laser-related equipment — Test methods for the spectral characteristics of lasers |
| IEC 60747-1:2006+AMD1:2010 CSV | Semiconductor devices - Part 1: General |
| IEC 60749:1996+AMD1:2000+AMD2:2001 CSV | Semiconductor devices - Mechanical and climatic test methods |
| ISO 17526:2003 | Optics and optical instruments Lasers and laser-related equipment Lifetime of lasers |
| ISO 12005:2003 | Lasers and laser-related equipment Test methods for laser beam parameters Polarization |
| ISO 11145:2016 | Optics and photonics Lasers and laser-related equipment Vocabulary and symbols |
| IEC 60664-1:2007 | Insulation coordination for equipment within low-voltage systems - Part 1: Principles, requirements and tests |
| IEC 61751:1998 | Laser modules used for telecommunication - Reliability assessment |
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