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IEC 60747-5-4:2006
Superseded
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Semiconductor devices - Discrete devices - Part 5-4: Optoelectronic devices - Semiconductor lasers
Hardcopy , PDF , PDF 3 Users , PDF 5 Users , PDF 9 Users
27-04-2022
English - French
23-02-2006
FOREWORD
1 Scope
2 Normative references
3 General
3.1 Physical concepts
3.3 General terms
3.4 Terms related to ratings and characteristics
4 Essential rating and characteristics
4.1 Type
4.2 Semiconductor
4.3 Details of outline drawing and encapsulation
4.4 Limiting values (absolute maximum ratings)
4.5 Electrical and optical characteristics
4.6 Supplementary information - Temperature dependence of
wavelength
5 Measurement methods
5.1 Power measurement
5.2 Output power stability
5.3 Time domain profile
5.4 Lifetime
5.5 Optical characteristics of the laser beam
Annex A (informative) Reference list of technical terms and
definitions related to spatial profile
and spectral characteristics
Annex B (informative) Reference list of measurement methods
related to spatial profile and spectral
characteristics
Annex C (informative) Reference list of technical terms and
definitions, and measurement methods,
related to power measurement and lifetime
Bibliography
Figures
Table
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