IEC 60747-5-4:2006
Superseded
A superseded Standard is one, which is fully replaced by another Standard, which is a new edition of the same Standard.
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Semiconductor devices - Discrete devices - Part 5-4: Optoelectronic devices - Semiconductor lasers
Hardcopy , PDF
English - French
23-02-2006
27-04-2022
FOREWORD
1 Scope
2 Normative references
3 General
3.1 Physical concepts
3.3 General terms
3.4 Terms related to ratings and characteristics
4 Essential rating and characteristics
4.1 Type
4.2 Semiconductor
4.3 Details of outline drawing and encapsulation
4.4 Limiting values (absolute maximum ratings)
4.5 Electrical and optical characteristics
4.6 Supplementary information - Temperature dependence of
wavelength
5 Measurement methods
5.1 Power measurement
5.2 Output power stability
5.3 Time domain profile
5.4 Lifetime
5.5 Optical characteristics of the laser beam
Annex A (informative) Reference list of technical terms and
definitions related to spatial profile
and spectral characteristics
Annex B (informative) Reference list of measurement methods
related to spatial profile and spectral
characteristics
Annex C (informative) Reference list of technical terms and
definitions, and measurement methods,
related to power measurement and lifetime
Bibliography
Figures
Table
Deals with the terminology, the essential ratings and characteristics as well as the measuring methods of semiconductor lasers.
| Committee |
TC 47/SC 47E
|
| DevelopmentNote |
To be read in conjunction with IEC 62007-1 and IEC 62007-2. (02/2006) Supersedes IEC 60747-5-1, IEC 60747-5-2 and IEC 60747-5-3. (02/2016) Stability Date: 2018. (09/2017)
|
| DocumentType |
Standard
|
| Pages |
59
|
| PublisherName |
International Electrotechnical Committee
|
| Status |
Superseded
|
| SupersededBy | |
| Supersedes |
| Standards | Relationship |
| NEN IEC 60747-5-4 : 2006 | Identical |
| BS IEC 60747-5-4:2006 | Identical |
| JIS C 5942:2010 | Identical |
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