• IEC 60747-5-4:2006

    Superseded A superseded Standard is one, which is fully replaced by another Standard, which is a new edition of the same Standard.

    Semiconductor devices - Discrete devices - Part 5-4: Optoelectronic devices - Semiconductor lasers

    Available format(s):  Hardcopy, PDF, PDF 3 Users, PDF 5 Users, PDF 9 Users

    Superseded date:  27-04-2022

    Language(s):  English - French

    Published date:  23-02-2006

    Publisher:  International Electrotechnical Committee

    Add To Cart

    Table of Contents - (Show below) - (Hide below)

    FOREWORD
    1 Scope
    2 Normative references
    3 General
      3.1 Physical concepts
      3.3 General terms
      3.4 Terms related to ratings and characteristics
    4 Essential rating and characteristics
      4.1 Type
      4.2 Semiconductor
      4.3 Details of outline drawing and encapsulation
      4.4 Limiting values (absolute maximum ratings)
      4.5 Electrical and optical characteristics
      4.6 Supplementary information - Temperature dependence of
          wavelength
    5 Measurement methods
      5.1 Power measurement
      5.2 Output power stability
      5.3 Time domain profile
      5.4 Lifetime
      5.5 Optical characteristics of the laser beam
    Annex A (informative) Reference list of technical terms and
                          definitions related to spatial profile
                          and spectral characteristics
    Annex B (informative) Reference list of measurement methods
                          related to spatial profile and spectral
                          characteristics
    Annex C (informative) Reference list of technical terms and
                          definitions, and measurement methods,
                          related to power measurement and lifetime
    Bibliography
    Figures
    Table

    Abstract - (Show below) - (Hide below)

    Deals with the terminology, the essential ratings and characteristics as well as the measuring methods of semiconductor lasers.

    General Product Information - (Show below) - (Hide below)

    Committee TC 47/SC 47E
    Development Note To be read in conjunction with IEC 62007-1 and IEC 62007-2. (02/2006) Supersedes IEC 60747-5-1, IEC 60747-5-2 and IEC 60747-5-3. (02/2016) Stability Date: 2018. (09/2017)
    Document Type Standard
    Publisher International Electrotechnical Committee
    Status Superseded
    Superseded By
    Supersedes

    Standards Referenced By This Book - (Show below) - (Hide below)

    IEC 60747-5-7:2016 Semiconductor devices - Part 5-7: Optoelectronic devices - Photodiodes and phototransistors

    Standards Referencing This Book - (Show below) - (Hide below)

    IEC 60270:2000+AMD1:2015 CSV High-voltage test techniques - Partial discharge measurements
    ISO 11554:2017 Optics and photonics — Lasers and laser-related equipment — Test methods for laser beam power, energy and temporal characteristics
    IEC 60050-731:1991 International Electrotechnical Vocabulary (IEV) - Part 731: Optical fibre communication
    IEC 60068-1:2013 Environmental testing - Part 1: General and guidance
    IEC 62007-1:2015 Semiconductor optoelectronic devices for fibre optic system applications - Part 1: Specification template for essential ratings and characteristics
    ISO 11146-1:2005 Lasers and laser-related equipment Test methods for laser beam widths, divergence angles and beam propagation ratios Part 1: Stigmatic and simple astigmatic beams
    ISO 13694:2015 Optics and photonics Lasers and laser-related equipment Test methods for laser beam power (energy) density distribution
    ISO 11146-2:2005 Lasers and laser-related equipment Test methods for laser beam widths, divergence angles and beam propagation ratios Part 2: General astigmatic beams
    IEC 60050-845:1987 International Electrotechnical Vocabulary (IEV) - Part 845: Lighting
    IEC 60825-1:2014 Safety of laser products - Part 1: Equipment classification and requirements
    ISO 11670:2003 Lasers and laser-related equipment Test methods for laser beam parameters Beam positional stability
    IEC 62007-2:2009 Semiconductor optoelectronic devices for fibre optic system applications - Part 2: Measuring methods
    IEC 60306-1:1969 Measurement of photosensitive devices - Part 1: Basic recommendations
    ISO 15367-1:2003 Lasers and laser-related equipment Test methods for determination of the shape of a laser beam wavefront Part 1: Terminology and fundamental aspects
    ISO 13695:2004 Optics and photonics Lasers and laser-related equipment Test methods for the spectral characteristics of lasers
    IEC 60747-1:2006+AMD1:2010 CSV Semiconductor devices - Part 1: General
    IEC 60749:1996+AMD1:2000+AMD2:2001 CSV Semiconductor devices - Mechanical and climatic test methods
    ISO 17526:2003 Optics and optical instruments Lasers and laser-related equipment Lifetime of lasers
    ISO 12005:2003 Lasers and laser-related equipment Test methods for laser beam parameters Polarization
    ISO 11145:2016 Optics and photonics Lasers and laser-related equipment Vocabulary and symbols
    IEC 60664-1:2007 Insulation coordination for equipment within low-voltage systems - Part 1: Principles, requirements and tests
    IEC 61751:1998 Laser modules used for telecommunication - Reliability assessment
    • Access your standards online with a subscription

      Features

      • Simple online access to standards, technical information and regulations
      • Critical updates of standards and customisable alerts and notifications
      • Multi - user online standards collection: secure, flexibile and cost effective