IEC 60747-7-5:2005
Superseded
A superseded Standard is one, which is fully replaced by another Standard, which is a new edition of the same Standard.
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Semiconductor devices - Discrete devices - Part 7-5: Bipolar transistors for power switching applications
Hardcopy , PDF , PDF 3 Users , PDF 5 Users , PDF 9 Users
16-12-2010
English
10-08-2005
Important note : Users cannot be edited or removed once added to your Multi user PDF.
FOREWORD
1 Scope
2 Normative references
3 Terms and definitions
4 Letter symbols -Energies
5 Essential ratings and characteristics
5.1 Ratings (limiting values)
5.2 Characteristics
6 Measuring methods
6.1 Verification of ratings (limiting values)
6.2 Methods of measurement
7 Acceptance and reliability
7.1 Endurance and reliability tests, and test methods
7.2 Type tests and routine tests
This part of IEC 60747 gives requirements for bipolar switching transistors used for power switching application above 1 A. NOTE: Requirements concerning bipolar transistors in general can be found in IEC 60747-7.
| DocumentType |
Standard
|
| Pages |
26
|
| PublisherName |
International Electrotechnical Committee
|
| Status |
Superseded
|
| SupersededBy |
| Standards | Relationship |
| NEN IEC 60747-7-5 : 2005 | Identical |
| BS IEC 60747-7-5:2005 | Identical |
| IEC 60747-7:2010 | Semiconductor devices - Discrete devices - Part 7: Bipolar transistors |
| IEC 60747-1:2006+AMD1:2010 CSV | Semiconductor devices - Part 1: General |
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