IEC 60747-8-3:1995
Superseded
A superseded Standard is one, which is fully replaced by another Standard, which is a new edition of the same Standard.
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Semiconductor devices - Discrete devices - Part 8: Field-effect transistors - Section 3: Blank detail specification for case-rated field effect transistors for switching applications
Hardcopy , PDF , PDF 3 Users , PDF 5 Users , PDF 9 Users
13-01-2014
English - French
20-04-1995
Important note : Users cannot be edited or removed once added to your Multi user PDF.
FOREWORD
INTRODUCTION
1 Mechanical description
2 Short description
3 Categories of assessed quality
4 Limiting values (absolute maximum rating system)
common to all applications
5 Electrical characteristics
6 Marking
7 Ordering information
8 Test conditions and inspection requirements
9 Group D - Qualification approval tests
10 Additional information (not for inspection purposes)
This publication also bears the number QC 750114 which is the specification number in the IEC Quality Assessment System for Electronic Components (IECQ).
| DevelopmentNote |
Also numbered as BS QC750114(1996) (08/2005) Stability Date: 2013. (10/2012)
|
| DocumentType |
Standard
|
| Pages |
37
|
| PublisherName |
International Electrotechnical Committee
|
| Status |
Superseded
|
| SupersededBy |
| IEC 61747-1:1998+AMD1:2003 CSV | Liquid crystal and solid-state display devices - Part 1: Generic specification |
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