IEC 60748-2-12:2001
Current
The latest, up-to-date edition.
Semiconductor devices - Integrated circuits - part2-12: Digital integrated circuits - Blank detail specification for programmable logic devices (PLDs)
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English - French
30-01-2001
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FOREWORD
INTRODUCTION
Clause
1 Marking and ordering information
1.1 Marking
1.2 Ordering information
2 Application related description
3 Specification of the function
3.1 Block diagram
3.2 Identification and function of terminals
3.3 Functional description
3.4 Family-related characteristics
4 Limiting values (absolute maximum rating system)
5 Operating conditions (within the specified
operating temperature range)
6 Electrical characteristics
6.1 Static characteristics
6.2 Dynamic characteristics
6.3 Timing diagram
6.4 Capacitances
7 Programming
7.1 Programming mode
7.2 Erasing mode (if applicable)
7.3 Number of programming-erasing cycles
(where appropriate)
7.4 Data retention information test
8 Additional information
9 Screening (if required)
10 Quality assessment procedures
10.1 Qualification approval procedures
10.2 Capability approval procedures
11 Structural similarity procedures
12 Test conditions and inspection requirements
12.1 General
12.2 Sampling requirements and formation of
inspection lots
12.3 Inspection tables
12.4 Delayed deliveries
13 Additional measurement method
13.1 Data retention test (destructive test)
13.2 Write/erase endurance: number of
programming cycles (destructive test)
13.3 Programmability
Reference documents
| DevelopmentNote |
Supersedes IEC 60186B. (07/2004) Stability Date: 2018. (09/2017)
|
| DocumentType |
Standard
|
| Pages |
51
|
| PublisherName |
International Electrotechnical Committee
|
| Status |
Current
|
| Supersedes |
| Standards | Relationship |
| BS QC790121(2001) : 2001 | Identical |
| NEN IEC 60748-2-12 : 2001 | Identical |
| BS IEC 60748-2-12:2001 | Identical |
| BS IEC 60748-2.12 : 2001 | Identical |
| IEC 60134:1961 | Rating systems for electronic tubes and valves and analogous semiconductor devices |
| IEC 60747-10:1991 | Semiconductor devices - Part 10: Generic specification for discrete devices and integrated circuits |
| IEC 60748-11:1990 | Semiconductor devices - Integrated circuits - Part 11: Sectional specification for semiconductor integrated circuits excluding hybrid circuits |
| IEC 60617-13:1993 | Graphical symbols for diagrams - Part 13: Analogue elements |
| IEC 60749:1996+AMD1:2000+AMD2:2001 CSV | Semiconductor devices - Mechanical and climatic test methods |
| IEC 60748-2:1997 | Semiconductor devices - Integrated circuits - Part 2: Digital integrated circuits |
| IEC 60748-3:1986 | Semiconductor devices - Integrated circuits - Part 3: Analogue integrated circuits |
| IEC 60748-4:1997 | Semiconductor devices - Integrated circuits - Part 4: Interface integrated circuits |
| IEC 60617-12:1997 | Graphical symbols for diagrams - Part 12: Binary logic elements |
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