IEC 60748-21:1997
Current
The latest, up-to-date edition.
Semiconductor devices - Integrated circuits - Part 21: Sectional specification for film integrated circuits and hybrid film integrated circuits on the basis of qualification approval procedures
Hardcopy , PDF , PDF 3 Users , PDF 5 Users , PDF 9 Users
English - French
10-04-1997
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CONTENTS
FOREWORD
Clause
1. Scope and object
2. General, preferred characteristics, ratings
and severities for environmental tests
2.1 Normative references
2.2 Preferred ratings and characteristics
2.3 Information to be given in a detail
specification
3. Qualification approval procedures
3.1 Structural similarity
3.2 Qualification approval
3.3 Assessment levels
3.4 Resubmission of rejected lots (for lot-by-lot
inspection)
3.5 Manufacturing stages in a factory of an approved
manufacturer in a non-IEC member country
4. Test and measurement procedures
5. Tables of method B
Tables
1. Test schedule for qualification approval for method A
2. Assessment levels and acceptance criteria for
qualification approval for method A
3. Assessment levels and acceptance criteria for quality
conformance inspection for method A
4. Screening
5. Test schedule for qualification approval for method B
6. Assessment levels and acceptance criteria for
qualification approval for method B
7. Assessment levels and acceptance criteria for quality
conformance inspection for method B
Applies to film and hybrid film integrated circuits, manufactured as catalogue or as custom-built products whose quality is assessed on the basis of Qualification Approval. Presents preferred values for rating and characteristics, selects from the generic specification the appropriate tests and measuring methods and gives general performance requirements to be used in detail specifications for film and hybrid film integrated circuits.
| Committee |
TC 47/SC 47A
|
| DevelopmentNote |
Also numbered as BS QC760100(1997). (09/2003) Supersedes IEC 60186B. (07/2004) Stability Date: 2020. (09/2017)
|
| DocumentType |
Standard
|
| Pages |
43
|
| PublisherName |
International Electrotechnical Committee
|
| Status |
Current
|
| Supersedes |
| Standards | Relationship |
| SAC GB/T 11498 : 2018 | Identical |
| NEN IEC 60748-21 : 1998 | Identical |
| BS QC 760101:1997 | Harmonized system of quality assessment for electronic components. Semiconductor devices. Integrated circuits. Blank detail specification for film integrated circuits and hybrid film integrated circuits on the basis of qualification approval procedures |
| BS QC 760200:1997 | Harmonized system of quality assessment for electronic components. Semiconductor devices. Integrated circuits. Sectional specification for film integrated circuits and hybrid film integrated circuits on the basis of the capability approval procedures |
| IEC 61747-1:1998+AMD1:2003 CSV | Liquid crystal and solid-state display devices - Part 1: Generic specification |
| IEC 60063:2015 | Preferred number series for resistors and capacitors |
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