IEC 60749-13:2018
Current
The latest, up-to-date edition.
Semiconductor devices - Mechanical and climatic test methods - Part 13: Salt atmosphere
Hardcopy , PDF , PDF 3 Users , PDF 5 Users , PDF 9 Users
English - French
15-02-2018
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FOREWORD
1 Scope
2 Normative references
3 Terms and definitions
4 Test apparatus
5 Procedure
6 Summary
Bibliography
IEC 60749-13:2018 describes a salt atmosphere test that determines the resistance of semiconductor devices to corrosion. It is an accelerated test that simulates the effects of severe sea-coast atmosphere on all exposed surfaces. It is only applicable to those devices specified for a marine environment. The salt atmosphere test is considered destructive.
This edition includes the following significant technical changes with respect to the previous edition:
a) alignment with MIL-STD-883J Method 1009.8, Salt Atmosphere (Corrosion), including information on conditioning and maintenance of the test chamber and mounting of test specimens (including explanatory figures).
| Committee |
TC 47
|
| DevelopmentNote |
Supersedes IEC PAS 62183 (08/2002) Supersedes IEC 60749. (03/2008) Stability Date: 2024. (02/2018)
|
| DocumentType |
Standard
|
| Pages |
28
|
| PublisherName |
International Electrotechnical Committee
|
| Status |
Current
|
| Supersedes |
| Standards | Relationship |
| CEI EN IEC 60749-13 : 2018 | Identical |
| UNE-EN IEC 60749-13:2018 | Identical |
| OVE EN IEC 60749-13: 2018 11 01 | Identical |
| BS EN IEC 60749-13:2018 | Identical |
| PN-EN IEC 60749-13:2018-11 | Identical |
| MIL-STD-883 Revision K:2016 | TEST METHOD STANDARD - MICROCIRCUITS |
| IEC 60749-14:2003 | Semiconductor devices - Mechanical and climatic test methods - Part 14: Robustness of terminations (lead integrity) |
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