IEC 60749-16:2003
Current
The latest, up-to-date edition.
Semiconductor devices - Mechanical and climatic test methods - Part 16: Particle impact noise detection (PIND)
Hardcopy , PDF
English - French, Spanish, Castilian
17-01-2003
Foreword
1 Scope
2 Terms and definitions
3 General remarks
4 Equipment
5 Test procedure
6 Failure criteria
7 Lot acceptance (for guidance)
8 Detail specification
9 Summary
Bibliography
Defines a test aiming at detecting the presence of loose particles inside a cavity device such as, for example, chips of ceramic, pieces of bonding wire or solder balls (prills).
| Committee |
TC 47
|
| DevelopmentNote |
Supersedes IEC PAS 62171 (04/2003) Stability Date: 2019. (11/2017)
|
| DocumentType |
Standard
|
| Pages |
13
|
| PublisherName |
International Electrotechnical Committee
|
| Status |
Current
|
| Supersedes |
| Standards | Relationship |
| NF EN 60749-16 : 2003 | Identical |
| NEN EN IEC 60749-16 : 2003 | Identical |
| I.S. EN 60749-16:2003 | Identical |
| PN EN 60749-16 : 2005 | Identical |
| CEI EN 60749-16 : 2005 | Identical |
| EN 60749-16:2003 | Identical |
| DIN EN 60749-16:2003-09 | Identical |
| BS EN 60749-16:2003 | Identical |
| UNE-EN 60749-16:2003 | Identical |
| 13/30264591 DC : 0 | BS EN 60747-14-6 ED 1.0 - SEMICONDUCTOR DEVICES - PART 14-6: SEMICONDUCTOR SENSORS - HUMIDITY SENSOR |
| 13/30264600 DC : 0 | BS EN 60747-14-8 ED 1.0 - SEMICONDUCTOR DEVICES - PART 14-8: SEMICONDUCTOR SENSORS - CAPACITIVE DEGRADATION SENSOR OF LIQUID |
| 13/30264596 DC : 0 | BS EN 60747-14-7 ED 1.0 - SEMICONDUCTOR DEVICES - PART 14-7: SEMICONDUCTOR SENSORS - FLOW METER |
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