IEC 60758:2016
Current
The latest, up-to-date edition.
Synthetic quartz crystal - Specifications and guidelines for use
Hardcopy , PDF , PDF 3 Users , PDF 5 Users , PDF 9 Users
English, English - French
18-05-2016
FOREWORD
INTRODUCTION
1 Scope
2 Normative references
3 Terms and definitions
4 Specification for synthetic quartz
crystal
5 Specification for lumbered synthetic
quartz crystal
6 Inspection rule for synthetic quartz
crystal and lumbered synthetic quartz
crystal
7 Guidelines for the use of synthetic quartz
crystal for piezoelectric applications
Annex A (informative) - Frequently used sampling
procedures
Annex B (informative) - Numerical example
Annex C (informative) - Example of reference
sample selection
Annex D (informative) - Explanations of point
callipers
Annex E (informative) - Infrared absorbance alpha
value compensation
Annex F (informative) - Differences of the orthogonal
axial system for quartz between IEC standard
and IEEE standard
Annex G (informative) - alpha value measurement
consistency between dispersive infrared spectrometer
and fourier transform infrared spectrometer
Bibliography
IEC 60758:2016 applies to synthetic quartz single crystals intended for manufacturing piezoelectric elements for frequency control, selection and optical applications. This edition includes the following significant technical changes with respect to the previous edition:
- order rearrangement and review of terms and definitions;
- abolition as a standard of the infrared absorbance coefficient α3410;
- addition of the value measurement explanation by FT-IR equipment in annex;
- addition of the synthetic quartz crystal standards for optical applications.
Committee |
TC 49
|
DevelopmentNote |
Supersedes 91/28919 DC. (07/2004) Stability date: 2020. (05/2016)
|
DocumentType |
Standard
|
Pages |
60
|
PublisherName |
International Electrotechnical Committee
|
Status |
Current
|
Supersedes |
Standards | Relationship |
UNE-EN 60758:2016 | Identical |
PN EN 60758 : 2016 | Identical |
EN 60758:2016 | Identical |
NBN EN 60758 : 2016 | Identical |
DIN EN 60758:2013-06 (Draft) | Identical |
BS EN 60758:2016 | Identical |
NEN EN IEC 60758 : 2016 | Identical |
CEI EN 60758 : 2010 | Identical |
SN EN 60758:2016 | Identical |
DIN IEC 60758:1994-02 | Identical |
PNE-FprEN 60758 | Identical |
NEN IEC 60758 : 1998 AMD 2 2001 | Identical |
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03/108069 DC : DRAFT MAY 2003 | IEC 62276 ED.1 - SINGLE CRYSTAL WAFERS APPLIED FOR SURFACE ACOUSTIC WAVE DEVICE - SPECIFICATION AND MEASURING METHOD |
IEC PAS 62276:2001 | Single crystal wafers applied for surface acoustic wave device - Specification and measuring method |
BS EN 62276:2016 | Single crystal wafers for surface acoustic wave (SAW) device applications. Specifications and measuring methods |
I.S. EN 62276:2016 | SINGLE CRYSTAL WAFERS FOR SURFACE ACOUSTIC WAVE (SAW) DEVICE APPLICATIONS - SPECIFICATIONS AND MEASURING METHODS |
EN 62276:2016 | Single crystal wafers for surface acoustic wave (SAW) device applications - Specifications and measuring methods |
IEC TS 61994-4-1:2007 | Piezoelectric and dielectric devices for frequency control and selection - Glossary - Part 4-1: Piezoelectric materials - Synthetic quartz crystal |
IEC 60068-1:2013 | Environmental testing - Part 1: General and guidance |
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IEC 60410:1973 | Sampling plans and procedures for inspection by attributes |
IEC 60122-2:1983 | Quartz crystal units for frequency control and selection - Part 2: Guide to the use of quartz crystal units for frequency control and selection |
IEC 60122-1:2002 | Quartz crystal units of assessed quality - Part 1: Generic specification |
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