IEC 61019-2:2005
Current
Current
The latest, up-to-date edition.
Surface acoustic wave (SAW) resonators - Part 2: Guide to the use
Available format(s)
Hardcopy , PDF , PDF 3 Users , PDF 5 Users , PDF 9 Users
Language(s)
English, English - French
Published date
12-05-2005
Publisher
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IEC 61019-2:2005 gives practical guidance to the use of surface acoustic wave (SAW) resonators which are used in telecommunications, radio equipments and consumer products. It is to be used in conjunction with IEC 61019-1. The features of SAW resonators are small size, light weight, adjustment-free and high stability,operating frequencies extend to the VHF and UHF ranges. The main changes with respect to the previous editon are listed below:
- at the end of 5.1, the edge reflector has been added. Its reference literature has been inserted in the bibliography;
- in Table 1, the propagation properties of LiNbO3 (64° Y) have been added;
- in Table 3, the clause and subclause numbers have been corrected in order to be consistent with IEC 61019-1 (2004) which has replaced IEC 61019-1-1 (1990) and IEC 61019-1-2 (1993).
| Committee |
TC 49
|
| DevelopmentNote |
A Bilingual edition has been published on 12/02/2014. (02/2014) Stability Date: 2019. (09/2017)
|
| DocumentType |
Standard
|
| Pages |
26
|
| PublisherName |
International Electrotechnical Committee
|
| Status |
Current
|
| Supersedes |
| Standards | Relationship |
| PN EN 61019-2 : 2007 | Identical |
| UNE-EN 61019-2:2005 | Identical |
| BS EN 61019-2:2005 | Identical |
| CEI EN 61019-2 : 2005 | Identical |
| EN 61019-2:2005 | Identical |
| NF EN 61019-2 : 2005 | Identical |
| I.S. EN 61019-2:2005 | Identical |
| NEN EN IEC 61019-2 : 2005 | Identical |
| DIN EN 61019-2:2006-01 | Identical |
| 09/30207175 DC : 0 | BS EN 62276 - SINGLE CRYSTAL WAFERS FOR SURFACE ACOUSTIC WAVE (SAW) DEVICE APPLICATIONS - SPECIFICATIONS AND MEASURING METHOD |
| PD IEC/PAS 62276:2002 | Single crystal wafers applied for surface acoustic wave device. Specification and measuring method |
| 15/30325282 DC : 0 | BS EN 62884-1 - MEASUREMENT TECHNIQUES OF PIEZOELECTRIC, DIELETIRIC AND ELECTROSTATIC OSCILLATORS - PART 1: BASIC METHODS FOR THE MEASUREMENT |
| CEI EN 62604-2 : 2012 | SURFACE ACOUSTIC WAVE (SAW) AND BULK ACOUSTIC WAVE (BAW) DUPLEXERS OF ASSESSED QUALITY - PART 2: GUIDELINES FOR THE USE |
| BS EN 62884-1:2017 | Measurement techniques of piezoelectric, dielectric and electrostatic oscillators Basic methods for the measurement |
| NF EN 62604-2 : 2013 | SURFACE ACOUSTIC WAVE (SAW) AND BULK ACOUSTIC WAVE (BAW) DUPLEXERS OF ASSESSED QUALITY - PART 2: GUIDELINES FOR THE USE |
| EN 61837-2:2011/A1:2014 | SURFACE MOUNTED PIEZOELECTRIC DEVICES FOR FREQUENCY CONTROL AND SELECTION - STANDARD OUTLINES AND TERMINAL LEAD CONNECTIONS - PART 2: CERAMIC ENCLOSURES (IEC 61837-2:2011/A1:2014) |
| EN 61019-1:2005 | Surface acoustic wave (SAW) resonators - Part 1: Generic specification |
| EN 60862-2:2012 | Surface acoustic wave (SAW) filters of assessed quality - Part 2: Guidelines for the use |
| 15/30318551 DC : 0 | BS EN 62276 ED. 3.0 - SINGLE CRYSTAL WAFERS FOR SURFACE ACOUSTIC WAVE (SAW) DEVICE APPLICATION - SPECIFICATIONS AND MEASURING METHODS |
| BS EN 60862-2:2012 | Surface acoustic wave (SAW) filters of assessed quality Guidelines for the use |
| 08/30192315 DC : 0 | BS EN 62604-2 - SURFACE ACOUSTIC WAVE (SAW) AND BULK ACOUSTIC WAVE (BAW) DUPLEXERS - PART 2: GUIDE TO THE USE |
| 14/30282293 DC : 0 | BS EN 60679-1 - PIEZOELECTRIC AND ASSOCIATED MATERIAL OSCILLATORS OF ASSESSED QUALITY - PART 1: GENERIC SPECIFICATION |
| I.S. EN 62604-2:2012 | SURFACE ACOUSTIC WAVE (SAW) AND BULK ACOUSTIC WAVE (BAW) DUPLEXERS OF ASSESSED QUALITY - PART 2: GUIDELINES FOR THE USE (IEC 62604-2:2011 (EQV)) |
| I.S. EN 61019-1:2005 | SURFACE ACOUSTIC WAVE (SAW) RESONATORS - PART 1: GENERIC SPECIFICATION |
| EN 62884-1:2017 | Measurement techniques of piezoelectric, dielectric and electrostatic oscillators - Part 1: Basic methods for the measurement |
| I.S. EN 60679-1:2017 | PIEZOELECTRIC, DIELECTRIC AND ELECTROSTATIC OSCILLATORS OF ASSESSED QUALITY - PART 1: GENERIC SPECIFICATION |
| IEC 62604-2:2017 | Surface acoustic wave (SAW) and bulk acoustic wave (BAW) duplexers of assessed quality - Part 2: Guidelines for the use |
| IEC 62276:2016 | Single crystal wafers for surface acoustic wave (SAW) device applications - Specifications and measuring methods |
| 09/30200395 DC : 0 | BS EN 61837-2 ED. 2 - SURFACE MOUNTED PIEZOELECTRIC DEVICES FOR FREQUENCY CONTROL AND SELECTION - STANDARD OUTLINES AND TERMINAL LEAD CONNECTIONS - PART 2: CERAMIC ENCLOSURES |
| BS EN 61019-1:2005 | Surface acoustic wave (SAW) resonators Generic specification |
| BS EN 60679-1:2017 | Piezoelectric, dielectric and electrostatic oscillators of assessed quality Generic specification |
| I.S. EN 62884-1:2017 | MEASUREMENT TECHNIQUES OF PIEZOELECTRIC, DIELECTRIC AND ELECTROSTATIC OSCILLATORS - PART 1: BASIC METHODS FOR THE MEASUREMENT |
| IEC 60679-1:2017 | Piezoelectric, dielectric and electrostatic oscillators of assessed quality - Part 1: Generic specification |
| 03/108069 DC : DRAFT MAY 2003 | IEC 62276 ED.1 - SINGLE CRYSTAL WAFERS APPLIED FOR SURFACE ACOUSTIC WAVE DEVICE - SPECIFICATION AND MEASURING METHOD |
| I.S. EN 61837-2:2011 | SURFACE MOUNTED PIEZOELECTRIC DEVICES FOR FREQUENCY CONTROL AND SELECTION - STANDARD OUTLINES AND TERMINAL LEAD CONNECTIONS - PART 2: CERAMIC ENCLOSURES |
| IEC PAS 62276:2001 | Single crystal wafers applied for surface acoustic wave device - Specification and measuring method |
| BS EN 62276:2016 | Single crystal wafers for surface acoustic wave (SAW) device applications. Specifications and measuring methods |
| EN 60679-1:2017 | Piezoelectric, dielectric and electrostatic oscillators of assessed quality - Part 1: Generic specification |
| I.S. EN IEC 62604-2:2018 | SURFACE ACOUSTIC WAVE (SAW) AND BULK ACOUSTIC WAVE (BAW) DUPLEXERS OF ASSESSED QUALITY - PART 2: GUIDELINES FOR THE USE |
| I.S. EN 62276:2016 | SINGLE CRYSTAL WAFERS FOR SURFACE ACOUSTIC WAVE (SAW) DEVICE APPLICATIONS - SPECIFICATIONS AND MEASURING METHODS |
| IEC 60862-2:2012 | Surface acoustic wave (SAW) filters of assessed quality - Part 2: Guidelines for the use |
| IEC 61019-1:2004 | Surface acoustic wave (SAW) resonators - Part 1: Generic specification |
| EN 62276:2016 | Single crystal wafers for surface acoustic wave (SAW) device applications - Specifications and measuring methods |
| 02/206181 DC : DRAFT MAY 2002 | IEC 61019-1. ED.1 - SURFACE ACOUSTIC WAVE RESONATORS (SAW) OF ASSESSED QUALITY - PART 1: GENERIC SPECIFICATION |
| I.S. EN 60862-2:2012 | SURFACE ACOUSTIC WAVE (SAW) FILTERS OF ASSESSED QUALITY - PART 2: GUIDELINES FOR THE USE (IEC 60862-2:2012 (EQV)) |
| BS EN 62604-2:2012 | Surface Acoustic Wave (SAW) and Bulk Acoustic Wave (BAW) duplexers of assessed quality Guidelines for the use |
| BS EN 61837-2 : 2011 | SURFACE MOUNTED PIEZOELECTRIC DEVICES FOR FREQUENCY CONTROL AND SELECTION - STANDARD OUTLINES AND TERMINAL LEAD CONNECTIONS - PART 2: CERAMIC ENCLOSURES |
| EN IEC 62604-2:2018 | Surface acoustic wave (SAW) and bulk acoustic wave (BAW) duplexers of assessed quality - Part 2: Guidelines for the use |
| IEC 62884-1:2017 | Measurement techniques of piezoelectric, dielectric and electrostatic oscillators - Part 1: Basic methods for the measurement |
| IEC 61019-1:2004 | Surface acoustic wave (SAW) resonators - Part 1: Generic specification |
| IEC 61019-3:1991 | Surface acoustic wave (SAW) resonators - Part 3: Standard outlines and lead connections |
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