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  • IEC 60862-2:2012

    Current The latest, up-to-date edition.

    Surface acoustic wave (SAW) filters of assessed quality - Part 2: Guidelines for the use

    Available format(s):  Hardcopy, PDF, PDF 3 Users, PDF 5 Users, PDF 9 Users

    Language(s):  English, English - French

    Published date:  07-05-2012

    Publisher:  International Electrotechnical Committee

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    Abstract - (Show below) - (Hide below)

    IEC 60862-2:2012 gives practical guidance on the use of SAW filters which are used in telecommunications, measuring equipment, radar systems and consumer products. IEC 60862-1 should be referred to for general information, standard values and test conditions. This part of IEC 60862 includes various kinds of filter configuration, of which the operating frequency range is from approximately 10 MHz to 3 GHz and the relative bandwidth is about 0,02 % to 50 % of the centre frequency. It is not the aim of this standard to explain theory, nor to attempt to cover all the eventualities which may arise in practical circumstances. This standard draws attention to some of the more fundamental questions, which should be considered by the user before he places an order for a SAW filter for a new application. Such a procedure will be the user's insurance against unsatisfactory performance. This edition includes the following significant technical changes with respect to the previous edition:
    - Clause 3 "Terms and definitions" has been deleted to be included in the next edition of IEC 60862-1;
    - the tapered IDT filter and the RSPUDT filter have been added to the clause of SAW transversal filters. Also DART, DWSF and EWC have been added as variations of SPUDT;
    - the balanced connection has been added to the subclause of coupled resonator filters;
    - recent substrate materials have been described;
    - a subclause about packaging of SAW filters has been added.

    General Product Information - (Show below) - (Hide below)

    Committee TC 49
    Development Note Stability Date: 2019. (09/2017)
    Document Type Standard
    Publisher International Electrotechnical Committee
    Status Current
    Supersedes

    Standards Referenced By This Book - (Show below) - (Hide below)

    BS EN 60862-1:2015 Surface acoustic wave (SAW) filters of assessed quality Generic specification
    09/30207175 DC : 0 BS EN 62276 - SINGLE CRYSTAL WAFERS FOR SURFACE ACOUSTIC WAVE (SAW) DEVICE APPLICATIONS - SPECIFICATIONS AND MEASURING METHOD
    03/108069 DC : DRAFT MAY 2003 IEC 62276 ED.1 - SINGLE CRYSTAL WAFERS APPLIED FOR SURFACE ACOUSTIC WAVE DEVICE - SPECIFICATION AND MEASURING METHOD
    02/203601 DC : DRAFT MAR 2002 IEC 60862-3. ED.2 - PIEZOELECTRIC AND DIELECTRIC DEVICES FOR FREQUENCY CONTROL AND SELECTION. SURFACE ACOUSTIC WAVE (SAW) FILTERS OF ASSESSED QUALITY - PART 3: STANDARD OUTLINES
    I.S. EN 62604-1:2015 SURFACE ACOUSTIC WAVE (SAW) AND BULK ACOUSTIC WAVE (BAW) DUPLEXERS OF ASSESSED QUALITY - PART 1: GENERIC SPECIFICATION
    DD IEC/TS 61994-2:2011 Piezoelectric, dielectric and electrostatic devices and associated materials for frequency control, selection and detection. Glossary Piezoelectric and dielectric filters
    PD IEC/PAS 62276:2002 Single crystal wafers applied for surface acoustic wave device. Specification and measuring method
    10/30240248 DC : 0 BS EN 60862-1 - SURFACE ACOUSTIC WAVE (SAW) FILTERS OF ASSESSED QUALITY - PART 1: GENERIC SPECIFICATION
    CEI EN 62604-2 : 2012 SURFACE ACOUSTIC WAVE (SAW) AND BULK ACOUSTIC WAVE (BAW) DUPLEXERS OF ASSESSED QUALITY - PART 2: GUIDELINES FOR THE USE
    I.S. EN 61837-3:2015 SURFACE MOUNTED PIEZOELECTRIC DEVICES FOR FREQUENCY CONTROL AND SELECTION - STANDARD OUTLINES AND TERMINAL LEAD CONNECTIONS - PART 3: METAL ENCLOSURES
    EN 61837-2:2011/A1:2014 SURFACE MOUNTED PIEZOELECTRIC DEVICES FOR FREQUENCY CONTROL AND SELECTION - STANDARD OUTLINES AND TERMINAL LEAD CONNECTIONS - PART 2: CERAMIC ENCLOSURES (IEC 61837-2:2011/A1:2014)
    EN 61837-3:2015 Surface mounted piezoelectric devices for frequency control and selection - Standard outlines and terminal lead connections - Part 3: Metal enclosures
    EN 62604-1:2015 Surface acoustic wave (SAW) and bulk acoustic wave (BAW) duplexers of assessed quality - Part 1: Generic specification
    15/30318551 DC : 0 BS EN 62276 ED. 3.0 - SINGLE CRYSTAL WAFERS FOR SURFACE ACOUSTIC WAVE (SAW) DEVICE APPLICATION - SPECIFICATIONS AND MEASURING METHODS
    08/30192315 DC : 0 BS EN 62604-2 - SURFACE ACOUSTIC WAVE (SAW) AND BULK ACOUSTIC WAVE (BAW) DUPLEXERS - PART 2: GUIDE TO THE USE
    BS EN 60862-3:2003 Surface acoustic wave (SAW) filters of assessed quality Standard outlines
    BS EN 62047-7:2011 SEMICONDUCTOR DEVICES - MICRO-ELECTROMECHANICAL DEVICES - PART 7: MEMS BAW FILTER AND DUPLEXER FOR RADIO FREQUENCY CONTROL AND SELECTION
    I.S. EN 62604-2:2012 SURFACE ACOUSTIC WAVE (SAW) AND BULK ACOUSTIC WAVE (BAW) DUPLEXERS OF ASSESSED QUALITY - PART 2: GUIDELINES FOR THE USE (IEC 62604-2:2011 (EQV))
    IEC TS 61994-2:2011 Piezoelectric, dielectric and electrostatic devices and associated materials for frequency control, selection and detection - Glossary - Part 2: Piezoelectric and dielectric filters
    IEC 62604-2:2017 Surface acoustic wave (SAW) and bulk acoustic wave (BAW) duplexers of assessed quality - Part 2: Guidelines for the use
    IEC 61837-3:2015 Surface mounted piezoelectric devices for frequency control and selection - Standard outlines and terminal lead connections - Part 3: Metal enclosures
    IEC 62276:2016 Single crystal wafers for surface acoustic wave (SAW) device applications - Specifications and measuring methods
    13/30278807 DC : 0 BS EN 61837-3 - SURFACE MOUNTED PIEZOELECTRIC DEVICES FOR FREQUENCY CONTROL AND SELECTI0N - STANDARD OUTLINES AND TERMINAL LEAD CONNECTIONS - PART 3: METAL ENCLOSURE
    IEC PAS 62276:2001 Single crystal wafers applied for surface acoustic wave device - Specification and measuring method
    EN IEC 62604-2:2018 Surface acoustic wave (SAW) and bulk acoustic wave (BAW) duplexers of assessed quality - Part 2: Guidelines for the use
    I.S. EN 60862-3:2003 SURFACE ACOUSTIC WAVE (SAW) FILTERS OF ASSESSED QUALITY - PART 3: STANDARD OUTLINES
    I.S. EN 62047-7:2011 SEMICONDUCTOR DEVICES - MICRO-ELECTROMECHANICAL DEVICES - PART 7: MEMS BAW FILTER AND DUPLEXER FOR RADIO FREQUENCY CONTROL AND SELECTION
    BS EN 62604-1:2015 Surface acoustic wave (SAW) and bulk acoustic wave (BAW) duplexers of assessed quality Generic specification
    12/30252220 DC : DRAFT MAR 2012 BS EN 62604-1 - SURFACE ACOUSTIC WAVE (SAW) AND BULK ACOUSTIC WAVE (BAW) DUPLEXERS - PART 1: GENERIC SPECIFICATION
    I.S. EN 61837-2:2011 SURFACE MOUNTED PIEZOELECTRIC DEVICES FOR FREQUENCY CONTROL AND SELECTION - STANDARD OUTLINES AND TERMINAL LEAD CONNECTIONS - PART 2: CERAMIC ENCLOSURES
    09/30200793 DC : 0 BS EN 61994-2 ED.2 - PIEZOELECTRIC AND DIELECTRIC DEVICES FOR FREQUENCY CONTROL AND SELECTION - GLOSSARY - PART 2: PIEZOELECTRIC AND DIELECTRIC FILTERS
    BS EN 62276:2016 Single crystal wafers for surface acoustic wave (SAW) device applications. Specifications and measuring methods
    I.S. EN IEC 62604-2:2018 SURFACE ACOUSTIC WAVE (SAW) AND BULK ACOUSTIC WAVE (BAW) DUPLEXERS OF ASSESSED QUALITY - PART 2: GUIDELINES FOR THE USE
    BS EN 61837-3:2015 Surface mounted piezoelectric devices for frequency control and selection. Standard outlines and terminal lead connections Metal enclosures
    I.S. EN 62276:2016 SINGLE CRYSTAL WAFERS FOR SURFACE ACOUSTIC WAVE (SAW) DEVICE APPLICATIONS - SPECIFICATIONS AND MEASURING METHODS
    IEC 62604-1:2015 Surface acoustic wave (SAW) and bulk acoustic wave (BAW) duplexers of assessed quality - Part 1: Generic specification
    IEC 60862-1:2015 Surface acoustic wave (SAW) filters of assessed quality - Part 1: Generic specification
    IEC 62047-7:2011 Semiconductor devices - Micro-electromechanical devices - Part 7: MEMS BAW filter and duplexer for radio frequency control and selection
    EN 60862-3:2003 Surface acoustic wave (SAW) filters of assessed quality - Part 3: Standard outlines
    EN 62276:2016 Single crystal wafers for surface acoustic wave (SAW) device applications - Specifications and measuring methods
    EN 60862-1:2015 Surface acoustic wave (SAW) filters of assessed quality - Part 1: Generic specification
    09/30200395 DC : 0 BS EN 61837-2 ED. 2 - SURFACE MOUNTED PIEZOELECTRIC DEVICES FOR FREQUENCY CONTROL AND SELECTION - STANDARD OUTLINES AND TERMINAL LEAD CONNECTIONS - PART 2: CERAMIC ENCLOSURES
    08/30172394 DC : DRAFT APR 2008 BS EN 62047-7 - SEMICONDUCTOR DEVICES - MICRO-ELECTROMECHANICAL DEVICES - PART 7: MEMS FBAR FILTER & DUPLEXER
    BS EN 62604-2:2012 Surface Acoustic Wave (SAW) and Bulk Acoustic Wave (BAW) duplexers of assessed quality Guidelines for the use
    CEI EN 62047-7 : 2012 SEMICONDUCTOR DEVICES - MICRO-ELECTROMECHANICAL DEVICES - PART 7: MEMS BAW FILTER AND DUPLEXER FOR RADIO FREQUENCY CONTROL AND SELECTION
    I.S. EN 60862-1:2015 SURFACE ACOUSTIC WAVE (SAW) FILTERS OF ASSESSED QUALITY - PART 1: GENERIC SPECIFICATION
    BS EN 61837-2 : 2011 SURFACE MOUNTED PIEZOELECTRIC DEVICES FOR FREQUENCY CONTROL AND SELECTION - STANDARD OUTLINES AND TERMINAL LEAD CONNECTIONS - PART 2: CERAMIC ENCLOSURES
    IEC 60862-3:2003 Surface acoustic wave (SAW) filters of assessed quality - Part 3: Standard outlines
    EN 62047-7 : 2011 SEMICONDUCTOR DEVICES - MICRO-ELECTROMECHANICAL DEVICES - PART 7: MEMS BAW FILTER AND DUPLEXER FOR RADIO FREQUENCY CONTROL AND SELECTION

    Standards Referencing This Book - (Show below) - (Hide below)

    IEC 60862-1:2015 Surface acoustic wave (SAW) filters of assessed quality - Part 1: Generic specification
    IEC 61019-2:2005 Surface acoustic wave (SAW) resonators - Part 2: Guide to the use
    IEC 60368-2-1:1988 Piezoelectric filters - Part 2-1: Guide to the use of piezoelectric filters - Quartz crystal filters
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