09/30207175 DC : 0
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BS EN 62276 - SINGLE CRYSTAL WAFERS FOR SURFACE ACOUSTIC WAVE (SAW) DEVICE APPLICATIONS - SPECIFICATIONS AND MEASURING METHOD |
PD IEC/PAS 62276:2002
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Single crystal wafers applied for surface acoustic wave device. Specification and measuring method |
15/30325282 DC : 0
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BS EN 62884-1 - MEASUREMENT TECHNIQUES OF PIEZOELECTRIC, DIELETIRIC AND ELECTROSTATIC OSCILLATORS - PART 1: BASIC METHODS FOR THE MEASUREMENT |
CEI EN 62604-2 : 2012
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SURFACE ACOUSTIC WAVE (SAW) AND BULK ACOUSTIC WAVE (BAW) DUPLEXERS OF ASSESSED QUALITY - PART 2: GUIDELINES FOR THE USE |
BS EN 62884-1:2017
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Measurement techniques of piezoelectric, dielectric and electrostatic oscillators Basic methods for the measurement |
NF EN 62604-2 : 2013
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SURFACE ACOUSTIC WAVE (SAW) AND BULK ACOUSTIC WAVE (BAW) DUPLEXERS OF ASSESSED QUALITY - PART 2: GUIDELINES FOR THE USE |
EN 61837-2:2011/A1:2014
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SURFACE MOUNTED PIEZOELECTRIC DEVICES FOR FREQUENCY CONTROL AND SELECTION - STANDARD OUTLINES AND TERMINAL LEAD CONNECTIONS - PART 2: CERAMIC ENCLOSURES (IEC 61837-2:2011/A1:2014) |
EN 61019-1 : 2005
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Surface acoustic wave (SAW) resonators - Part 1: Generic specification |
EN 60862-2:2012
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Surface acoustic wave (SAW) filters of assessed quality - Part 2: Guidelines for the use |
15/30318551 DC : 0
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BS EN 62276 ED. 3.0 - SINGLE CRYSTAL WAFERS FOR SURFACE ACOUSTIC WAVE (SAW) DEVICE APPLICATION - SPECIFICATIONS AND MEASURING METHODS |
BS EN 60862-2:2012
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Surface acoustic wave (SAW) filters of assessed quality Guidelines for the use |
08/30192315 DC : 0
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BS EN 62604-2 - SURFACE ACOUSTIC WAVE (SAW) AND BULK ACOUSTIC WAVE (BAW) DUPLEXERS - PART 2: GUIDE TO THE USE |
14/30282293 DC : 0
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BS EN 60679-1 - PIEZOELECTRIC AND ASSOCIATED MATERIAL OSCILLATORS OF ASSESSED QUALITY - PART 1: GENERIC SPECIFICATION |
I.S. EN 62604-2:2012
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SURFACE ACOUSTIC WAVE (SAW) AND BULK ACOUSTIC WAVE (BAW) DUPLEXERS OF ASSESSED QUALITY - PART 2: GUIDELINES FOR THE USE (IEC 62604-2:2011 (EQV)) |
I.S. EN 61019-1:2005
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SURFACE ACOUSTIC WAVE (SAW) RESONATORS - PART 1: GENERIC SPECIFICATION |
EN 62884-1:2017
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Measurement techniques of piezoelectric, dielectric and electrostatic oscillators - Part 1: Basic methods for the measurement |
I.S. EN 60679-1:2017
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PIEZOELECTRIC, DIELECTRIC AND ELECTROSTATIC OSCILLATORS OF ASSESSED QUALITY - PART 1: GENERIC SPECIFICATION |
IEC 62604-2:2017
|
Surface acoustic wave (SAW) and bulk acoustic wave (BAW) duplexers of assessed quality - Part 2: Guidelines for the use |
IEC 62276:2016
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Single crystal wafers for surface acoustic wave (SAW) device applications - Specifications and measuring methods |
09/30200395 DC : 0
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BS EN 61837-2 ED. 2 - SURFACE MOUNTED PIEZOELECTRIC DEVICES FOR FREQUENCY CONTROL AND SELECTION - STANDARD OUTLINES AND TERMINAL LEAD CONNECTIONS - PART 2: CERAMIC ENCLOSURES |
BS EN 61019-1:2005
|
Surface acoustic wave (SAW) resonators Generic specification |
BS EN 60679-1:2017
|
Piezoelectric, dielectric and electrostatic oscillators of assessed quality Generic specification |
I.S. EN 62884-1:2017
|
MEASUREMENT TECHNIQUES OF PIEZOELECTRIC, DIELECTRIC AND ELECTROSTATIC OSCILLATORS - PART 1: BASIC METHODS FOR THE MEASUREMENT |
IEC 60679-1:2017
|
Piezoelectric, dielectric and electrostatic oscillators of assessed quality - Part 1: Generic specification |
03/108069 DC : DRAFT MAY 2003
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IEC 62276 ED.1 - SINGLE CRYSTAL WAFERS APPLIED FOR SURFACE ACOUSTIC WAVE DEVICE - SPECIFICATION AND MEASURING METHOD |
I.S. EN 61837-2:2011
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SURFACE MOUNTED PIEZOELECTRIC DEVICES FOR FREQUENCY CONTROL AND SELECTION - STANDARD OUTLINES AND TERMINAL LEAD CONNECTIONS - PART 2: CERAMIC ENCLOSURES |
IEC PAS 62276:2001
|
Single crystal wafers applied for surface acoustic wave device - Specification and measuring method |
BS EN 62276:2016
|
Single crystal wafers for surface acoustic wave (SAW) device applications. Specifications and measuring methods |
EN 60679-1:2017
|
Piezoelectric, dielectric and electrostatic oscillators of assessed quality - Part 1: Generic specification |
I.S. EN IEC 62604-2:2018
|
SURFACE ACOUSTIC WAVE (SAW) AND BULK ACOUSTIC WAVE (BAW) DUPLEXERS OF ASSESSED QUALITY - PART 2: GUIDELINES FOR THE USE |
I.S. EN 62276:2016
|
SINGLE CRYSTAL WAFERS FOR SURFACE ACOUSTIC WAVE (SAW) DEVICE APPLICATIONS - SPECIFICATIONS AND MEASURING METHODS |
IEC 60862-2:2012
|
Surface acoustic wave (SAW) filters of assessed quality - Part 2: Guidelines for the use |
IEC 61019-1:2004
|
Surface acoustic wave (SAW) resonators - Part 1: Generic specification |
EN 62276:2016
|
Single crystal wafers for surface acoustic wave (SAW) device applications - Specifications and measuring methods |
02/206181 DC : DRAFT MAY 2002
|
IEC 61019-1. ED.1 - SURFACE ACOUSTIC WAVE RESONATORS (SAW) OF ASSESSED QUALITY - PART 1: GENERIC SPECIFICATION |
I.S. EN 60862-2:2012
|
SURFACE ACOUSTIC WAVE (SAW) FILTERS OF ASSESSED QUALITY - PART 2: GUIDELINES FOR THE USE (IEC 60862-2:2012 (EQV)) |
BS EN 62604-2:2012
|
Surface Acoustic Wave (SAW) and Bulk Acoustic Wave (BAW) duplexers of assessed quality Guidelines for the use |
BS EN 61837-2 : 2011
|
SURFACE MOUNTED PIEZOELECTRIC DEVICES FOR FREQUENCY CONTROL AND SELECTION - STANDARD OUTLINES AND TERMINAL LEAD CONNECTIONS - PART 2: CERAMIC ENCLOSURES |
EN IEC 62604-2:2018
|
Surface acoustic wave (SAW) and bulk acoustic wave (BAW) duplexers of assessed quality - Part 2: Guidelines for the use |
IEC 62884-1:2017
|
Measurement techniques of piezoelectric, dielectric and electrostatic oscillators - Part 1: Basic methods for the measurement |