IEC 61019-3:1991
Current
Current
The latest, up-to-date edition.
Surface acoustic wave (SAW) resonators - Part 3: Standard outlines and lead connections
Available format(s)
Hardcopy , PDF
Language(s)
English - French
Published date
24-12-1991
Publisher
€82.26
Excluding VAT
Loose-leaf booklet containing standard outlines and lead connections of surface acoustic wave (SAW) resonators. Six sheets are included and supplements will be issued as new outlines are developed.
| Committee |
TC 49
|
| DevelopmentNote |
Stability Date: 2017. (09/2017)
|
| DocumentType |
Standard
|
| Pages |
24
|
| PublisherName |
International Electrotechnical Committee
|
| Status |
Current
|
| Standards | Relationship |
| DIN IEC 61019-3:1993-09 | Identical |
| 09/30207175 DC : 0 | BS EN 62276 - SINGLE CRYSTAL WAFERS FOR SURFACE ACOUSTIC WAVE (SAW) DEVICE APPLICATIONS - SPECIFICATIONS AND MEASURING METHOD |
| PD IEC/PAS 62276:2002 | Single crystal wafers applied for surface acoustic wave device. Specification and measuring method |
| I.S. EN 61837-3:2015 | SURFACE MOUNTED PIEZOELECTRIC DEVICES FOR FREQUENCY CONTROL AND SELECTION - STANDARD OUTLINES AND TERMINAL LEAD CONNECTIONS - PART 3: METAL ENCLOSURES |
| EN 61019-1:2005 | Surface acoustic wave (SAW) resonators - Part 1: Generic specification |
| EN 61837-3:2015 | Surface mounted piezoelectric devices for frequency control and selection - Standard outlines and terminal lead connections - Part 3: Metal enclosures |
| 15/30318551 DC : 0 | BS EN 62276 ED. 3.0 - SINGLE CRYSTAL WAFERS FOR SURFACE ACOUSTIC WAVE (SAW) DEVICE APPLICATION - SPECIFICATIONS AND MEASURING METHODS |
| IEC 61837-3:2015 | Surface mounted piezoelectric devices for frequency control and selection - Standard outlines and terminal lead connections - Part 3: Metal enclosures |
| IEC 62276:2016 | Single crystal wafers for surface acoustic wave (SAW) device applications - Specifications and measuring methods |
| 03/108069 DC : DRAFT MAY 2003 | IEC 62276 ED.1 - SINGLE CRYSTAL WAFERS APPLIED FOR SURFACE ACOUSTIC WAVE DEVICE - SPECIFICATION AND MEASURING METHOD |
| BS EN 61019-1:2005 | Surface acoustic wave (SAW) resonators Generic specification |
| I.S. EN 61019-1:2005 | SURFACE ACOUSTIC WAVE (SAW) RESONATORS - PART 1: GENERIC SPECIFICATION |
| IEC PAS 62276:2001 | Single crystal wafers applied for surface acoustic wave device - Specification and measuring method |
| BS EN 61019-2:2005 | Surface acoustic wave (SAW) resonators Guide to the use |
| BS EN 62276:2016 | Single crystal wafers for surface acoustic wave (SAW) device applications. Specifications and measuring methods |
| I.S. EN 61019-2:2005 | SURFACE ACOUSTIC WAVE (SAW) RESONATORS - PART 2: GUIDE TO THE USE |
| I.S. EN 62276:2016 | SINGLE CRYSTAL WAFERS FOR SURFACE ACOUSTIC WAVE (SAW) DEVICE APPLICATIONS - SPECIFICATIONS AND MEASURING METHODS |
| IEC 61019-1:2004 | Surface acoustic wave (SAW) resonators - Part 1: Generic specification |
| IEC 61019-2:2005 | Surface acoustic wave (SAW) resonators - Part 2: Guide to the use |
| EN 62276:2016 | Single crystal wafers for surface acoustic wave (SAW) device applications - Specifications and measuring methods |
| 02/206181 DC : DRAFT MAY 2002 | IEC 61019-1. ED.1 - SURFACE ACOUSTIC WAVE RESONATORS (SAW) OF ASSESSED QUALITY - PART 1: GENERIC SPECIFICATION |
| EN 61019-2:2005 | Surface acoustic wave (SAW) resonators - Part 2: Guide to the use |
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