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IEC 61338-1-5:2015

Current

Current

The latest, up-to-date edition.

Waveguide type dielectric resonators - Part 1-5: General information and test conditions - Measurement method of conductivity at interface between conductor layer and dielectric substrate at microwave frequency

Available format(s)

Hardcopy , PDF , PDF 3 Users , PDF 5 Users , PDF 9 Users

Language(s)

English - French

Published date

25-06-2015

€119.56
Excluding VAT

IEC 61338-1-5:2015 describes a measurement method for resistance and effective conductivity at the interface between conductor layer and dielectric substrate, which are called interface resistance and interface conductivity. This first edition cancels and replaces IEC PAS 61338-1-5 published in 2010. This edition includes the following significant technical changes with respect to the previous edition:
a) description of technical content related to patents (Japanese patent numbers JP3634966, JP3735501) in the Introduction;
b) changes to normative references;
c)addition to bibliography.

Committee
TC 49
DevelopmentNote
Supersedes IEC PAS 61338-1-5. Stability date: 2017. (07/2015)
DocumentType
Standard
Pages
40
PublisherName
International Electrotechnical Committee
Status
Current
Supersedes

IEC 62562:2010 Cavity resonator method to measure the complex permittivity of low-loss dielectric plates
IEC 61338-1-3:1999 Waveguide type dielectric resonators - Part 1-3: General information and test conditions - Measurement method of complex relative permittivity for dielectric resonator materials at microwave frequency

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