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IEC 61649:1997
Superseded
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Goodness-of-fit tests, confidence intervals and lower confidence limits for Weibull distributed data
Hardcopy , PDF , PDF 3 Users , PDF 5 Users , PDF 9 Users
12-09-2022
English - French, Spanish, Castilian
16-05-1997
Provides numerical methods to complement graphical techniques in performing a goodness-of-fit test for Weibull distributed times to failure and gives an approximate procedure to obtain confidence intervals for the parameters of the two-parameter Weibull distribution when these are estimated by maximum likelihood. Applicable whenever a random sample of items is subjected to a test of times to failure for the purpose of estimating measures of reliability performance of the population from which these items were drawn.
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