IEC 61671-2:2016
Current
The latest, up-to-date edition.
Standard for automatic test markup language (ATML) instrument description
Hardcopy , PDF , PDF 3 Users , PDF 5 Users , PDF 9 Users
English
08-04-2016
Important note : Users cannot be edited or removed once added to your Multi user PDF.
1 Overview
2 Normative references
3 Definitions, abbreviations, and acronyms
4 InstrumentDescription schema
5 InstrumentDescription instance schema
6 ATML InstrumentDescription XML schema
names and locations
7 ATML XML schema extensibility
8 Conformance
Annex A (informative) - IEEE download Web site material
associated with this document
Annex B (informative) - Users information and examples
Annex C (informative) - Glossary
Annex D (informative) - Bibliography
Annex E (informative) - IEEE List of Participants
IEC 61671-2:2016(E) defines an exchange format, utilizing extensible markup language (XML), for both the static description of instrument models, and the specific description of instrument instance information.
| DevelopmentNote |
Also numbered as IEEE 1671.2. Stability date: 2021. (04/2016)
|
| DocumentType |
Standard
|
| Pages |
42
|
| PublisherName |
International Electrotechnical Committee
|
| Status |
Current
|
| Standards | Relationship |
| BS IEC 61671-2:2016 | Identical |
| NEN IEC 61671-2 : 2016 | Identical |
| BS EN 61000-4-4:2012 | Identical |
| IEEE 1057-2007 REDLINE | IEEE Standard for Digitizing Waveform Recorders |
| IEEE 1155 : 1992 | VMEBUS EXTENSIONS FOR INSTRUMENTATION: VXIBUS |
| TIA 232 : F1997(R2012) | INTERFACE BETWEEN DATA TERMINAL EQUIPMENT AND DATA CIRCUIT-TERMINATING EQUIPMENT EMPLOYING SERIAL BINARY DATA INTERCHANGE |
| IEEE 802.3-2012 | IEEE Standard for Ethernet |
| IEEE 1671.6-2015 | IEEE Standard for Automatic Test Markup Language (ATML) Test Station Description |
| IEEE 260.1 : 2004 | LETTER SYMBOLS FOR UNITS OF MEASUREMENT (SI UNITS, CUSTOMARY INCH-POUND UNITS, AND CERTAIN OTHER UNITS) |
| MIL-PRF-55310 Revision E:2006 | OSCILLATOR, CRYSTAL CONTROLLED, GENERAL SPECIFICATION FOR |
| MIL-STD-1309 Revision D:1992 | DEFINITIONS OF TERMS FOR TEST, MEASUREMENT AND DIAGNOSTIC EQUIPMENT |
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