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  • IEEE 1671.6-2015 REDLINE

    Current The latest, up-to-date edition.

    IEEE Standard for Automatic Test Markup Language (ATML) Test Station Description

    Available format(s):  Hardcopy, PDF

    Language(s):  English

    Published date:  08-05-2015

    Publisher:  Institute of Electrical & Electronics Engineers

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    Table of Contents - (Show below) - (Hide below)

    1 Overview
    2 Normative references
    3 Definitions, acronyms, and abbreviations
    4 Schema - TestStationDescription.xsd
    5 Schema - TestStationInstance.xsd
    6 ATML TestStationDescription XML schema
      names and locations
    7 ATML XML schema extensibility
    8 Conformance
    Annex A (informative) - IEEE download website
            material associated with this document
    Annex B (informative) - User's information and
            examples
    Annex C (informative) - Glossary
    Annex D (informative) - Bibliography

    Abstract - (Show below) - (Hide below)

    This standard defines an exchange format, utilizing eXtensible Markup Language (XML), for both the static description of a test station, and the specific description of test station instance information.

    General Product Information - (Show below) - (Hide below)

    Committee SCC20 - Test and Diagnosis for Electronic Sys
    Development Note PDF along with XML Schemas and reference example files is also available in zip format. (05/2015) Also numbered as IEC 61671-6. (04/2016)
    Document Type Standard
    Publisher Institute of Electrical & Electronics Engineers
    Status Current
    Supersedes

    Standards Referenced By This Book - (Show below) - (Hide below)

    DEFSTAN 66-031(PT8)/2(2016) : 2016 REQUIREMENTS FOR ELECTRONIC AND ELECTRICAL TEST AND MEASUREMENT EQUIPMENT - PART 8: REQUIREMENTS FOR AUTOMATIC TEST SYSTEMS UTILISING AN OPEN SYSTEM ARCHITECTURE
    DEFSTAN 00-52/4(2014) : 2014 THE GENERAL REQUIREMENTS FOR PRODUCT ACCEPTANCE AND MAINTENANCE TEST SPECIFICATIONS AND TEST SCHEDULES
    BS IEC 61671-2:2016 Standard for automatic test markup language (ATML) instrument description
    IEC 61671-2:2016 Standard for automatic test markup language (ATML) instrument description
    BS IEC 61671:2012 IEEE standard for automatic test markup language (ATML) for exchanging automatic test equipment and test information via XML
    IEC 61671:2012 Automatic Test Markup Language (ATML) for Exchanging Automatic Test Equipment and Test Information via XML
    IEEE 1641.1-2013 IEEE Guide for the Use of IEEE Std 1641, IEEE Standard for Signal and Test Definition
    IEEE 1671.2-2012 IEEE Standard for Automatic Test Markup Language (ATML) Instrument Description
    IEEE 1871.2-2017 IEEE Recommended Practice for IEEE 1671 Test Equipment Templates and Extension Classes for Describing Intrinsic Signal Path Information for Cables, Interface Adapters, and Test Equipment

    Standards Referencing This Book - (Show below) - (Hide below)

    IEEE 1671-2010 IEEE Standard for Automatic Test Markup Language (ATML) for Exchanging Automatic Test Equipment and Test Information via XML
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