IEC 62008:2005
Current
The latest, up-to-date edition.
Performance characteristics and calibration methods for digital data acquisition systems and relevant software
Hardcopy , PDF , PDF 3 Users , PDF 5 Users , PDF 9 Users
English - French, Spanish, Castilian
18-07-2005
FOREWORD
INTRODUCTION
1 Scope
2 Normative references
3 Terms, definitions, abbreviations and symbols
3.1 Terms and definitions
3.2 Abbreviations and symbols
4 General requirements
4.1 Test procedures and measurement uncertainty estimation
4.2 General requirements for ADMs
4.3 Descriptions of parameters
4.4 Testing methods of measurable parameters
5 Hardware functionality for calibration
5.1 Onboard calibration information
5.2 General measurement adjustment hardware
5.3 Self-adjustment hardware
6 Software calibration methods
6.1 Calibration application programming interface (API)
6.2 Self-calibration methods
6.3 External calibration methods
7 Calibration procedures
Annex A (informative) Examples of calculation of modular DAQ
system uncertainty
Annex B (normative) Pseudo-code to perform static test by
method B (see 4.4.1.2) and a numerical
example
Annex C (informative) ADM characteristics
Bibliography
Specifies performance characteristics and calibration methods for digital data acquisition systems and relevant software to ensure that all measurement systems relying on DAQ devices meet a common standard. This standard covers: - the minimum specifications that the DAQ device manufacturer must provide to describe the performance of the analogue-to-digital module (ADM) of the DAQ device; - standard test strategies to verify the minimum set of specifications; - the minimum calibration information required by the ADM that is stored on the DAQ device; - the minimum calibration software requirements for external and self-calibration of the ADM of the DAQ device. This standard deals with low frequency signal conversion, e.g. applications such as plant control, vibration measurement, vibro-diagnostics, acoustics, ultrasonic measurements, temperature measurements, pressure measurements, measurement in power electronics, etc.
Committee |
TC 85
|
DevelopmentNote |
Stability Date: 2017. (10/2012)
|
DocumentType |
Standard
|
Pages |
93
|
PublisherName |
International Electrotechnical Committee
|
Status |
Current
|
Standards | Relationship |
NF EN 62008 : 2006 | Identical |
NEN EN IEC 62008 : 2005 | Identical |
I.S. EN 62008:2005 | Identical |
PN EN 62008 : 2006 | Identical |
SN EN 62008 : 2005 | Identical |
BS EN 62008:2005 | Identical |
UNE-EN 62008:2006 | Identical |
CEI EN 62008 : 2006 | Identical |
DIN EN 62008:2006-07 | Identical |
EN 62008:2005 | Identical |
BS EN 61400-21:2008 | Wind turbines Measurement and assessment of power quality characteristics of grid connected wind turbines |
I.S. EN 61400-21:2008 | WIND TURBINES - PART 21: MEASUREMENT AND ASSESSMENT OF POWER QUALITY CHARACTERISTICS OF GRID CONNECTED WIND TURBINES |
BIS IS/IEC 61400-21 : 2008 | WIND TURBINES - PART 21: MEASUREMENT AND ASSESSMENT OF POWER QUALITY CHARACTERISTICS OF GRID CONNECTED WIND TURBINES |
NF EN 61400-21 : 2009 | WIND TURBINES - PART 21: MEASUREMENT AND ASSESSMENT OF POWER QUALITY CHARACTERISTICS OF GRID CONNECTED WIND TURBINES |
IEC 61400-21:2008 | Wind turbines - Part 21: Measurement and assessment of power quality characteristics of grid connected wind turbines |
CEI EN 61400-21 : 2011 | WIND TURBINES - PART 21: MEASUREMENT AND ASSESSMENT OF POWER QUALITY CHARACTERISTICS OF GRID CONNECTED WIND TURBINES |
EN 61400-21:2008 | WIND TURBINES - PART 21: MEASUREMENT AND ASSESSMENT OF POWER QUALITY CHARACTERISTICS OF GRID CONNECTED WIND TURBINES |
ISO/IEC 17025:2005 | General requirements for the competence of testing and calibration laboratories |
IEEE 1057-2007 REDLINE | IEEE Standard for Digitizing Waveform Recorders |
IEC 60748-4-3:2006 | Semiconductor devices - Integrated circuits - Part 4-3: Interface integrated circuits - Dynamic criteria for analogue-digital converters (ADC) |
IEC 60359:2001 | Electrical and electronic measurement equipment - Expression of performance |
IEC 61083-1:2001 | Instruments and software used for measurement in high-voltage impulse tests - Part 1: Requirements for instruments |
IEC 60748-4:1997 | Semiconductor devices - Integrated circuits - Part 4: Interface integrated circuits |
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