• IEC 62008:2005

    Current The latest, up-to-date edition.

    Performance characteristics and calibration methods for digital data acquisition systems and relevant software

    Available format(s):  Hardcopy, PDF, PDF 3 Users, PDF 5 Users, PDF 9 Users

    Language(s):  English - French, Spanish, Castilian

    Published date:  18-07-2005

    Publisher:  International Electrotechnical Committee

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    Table of Contents - (Show below) - (Hide below)

    FOREWORD
    INTRODUCTION
    1 Scope
    2 Normative references
    3 Terms, definitions, abbreviations and symbols
      3.1 Terms and definitions
      3.2 Abbreviations and symbols
    4 General requirements
      4.1 Test procedures and measurement uncertainty estimation
      4.2 General requirements for ADMs
      4.3 Descriptions of parameters
      4.4 Testing methods of measurable parameters
    5 Hardware functionality for calibration
      5.1 Onboard calibration information
      5.2 General measurement adjustment hardware
      5.3 Self-adjustment hardware
    6 Software calibration methods
      6.1 Calibration application programming interface (API)
      6.2 Self-calibration methods
      6.3 External calibration methods
    7 Calibration procedures
    Annex A (informative) Examples of calculation of modular DAQ
                          system uncertainty
    Annex B (normative) Pseudo-code to perform static test by
                        method B (see 4.4.1.2) and a numerical
                        example
    Annex C (informative) ADM characteristics
    Bibliography

    Abstract - (Show below) - (Hide below)

    Specifies performance characteristics and calibration methods for digital data acquisition systems and relevant software to ensure that all measurement systems relying on DAQ devices meet a common standard. This standard covers: - the minimum specifications that the DAQ device manufacturer must provide to describe the performance of the analogue-to-digital module (ADM) of the DAQ device; - standard test strategies to verify the minimum set of specifications; - the minimum calibration information required by the ADM that is stored on the DAQ device; - the minimum calibration software requirements for external and self-calibration of the ADM of the DAQ device. This standard deals with low frequency signal conversion, e.g. applications such as plant control, vibration measurement, vibro-diagnostics, acoustics, ultrasonic measurements, temperature measurements, pressure measurements, measurement in power electronics, etc.

    General Product Information - (Show below) - (Hide below)

    Committee TC 85
    Development Note Stability Date: 2017. (10/2012)
    Document Type Standard
    Publisher International Electrotechnical Committee
    Status Current

    Standards Referenced By This Book - (Show below) - (Hide below)

    BS EN 61400-21:2008 Wind turbines Measurement and assessment of power quality characteristics of grid connected wind turbines
    I.S. EN 61400-21:2008 WIND TURBINES - PART 21: MEASUREMENT AND ASSESSMENT OF POWER QUALITY CHARACTERISTICS OF GRID CONNECTED WIND TURBINES
    BIS IS/IEC 61400-21 : 2008 WIND TURBINES - PART 21: MEASUREMENT AND ASSESSMENT OF POWER QUALITY CHARACTERISTICS OF GRID CONNECTED WIND TURBINES
    NF EN 61400-21 : 2009 WIND TURBINES - PART 21: MEASUREMENT AND ASSESSMENT OF POWER QUALITY CHARACTERISTICS OF GRID CONNECTED WIND TURBINES
    IEC 61400-21:2008 Wind turbines - Part 21: Measurement and assessment of power quality characteristics of grid connected wind turbines
    CEI EN 61400-21 : 2011 WIND TURBINES - PART 21: MEASUREMENT AND ASSESSMENT OF POWER QUALITY CHARACTERISTICS OF GRID CONNECTED WIND TURBINES
    EN 61400-21:2008 WIND TURBINES - PART 21: MEASUREMENT AND ASSESSMENT OF POWER QUALITY CHARACTERISTICS OF GRID CONNECTED WIND TURBINES

    Standards Referencing This Book - (Show below) - (Hide below)

    ISO/IEC 17025:2005 General requirements for the competence of testing and calibration laboratories
    IEEE 1057-2007 REDLINE IEEE Standard for Digitizing Waveform Recorders
    IEC 60748-4-3:2006 Semiconductor devices - Integrated circuits - Part 4-3: Interface integrated circuits - Dynamic criteria for analogue-digital converters (ADC)
    IEC 60359:2001 Electrical and electronic measurement equipment - Expression of performance
    IEC 61083-1:2001 Instruments and software used for measurement in high-voltage impulse tests - Part 1: Requirements for instruments
    IEC 60748-4:1997 Semiconductor devices - Integrated circuits - Part 4: Interface integrated circuits
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