IEC 62220-1:2003

FOREWORD
INTRODUCTION
1 Scope
2 Normative references
3 Terminology and definitions
4 Requirements
  4.1 Operating conditions
  4.2 X-RAY EQUIPMENT
  4.3 RADIATION QUALITY
  4.4 TEST DEVICE
  4.5 Geometry
  4.6 IRRADIATION conditions
      4.6.1 General conditions
      4.6.2 Exposure measurement
      4.6.3 Avoidance of LAG EFFECTS
      4.6.4 IRRADIATION to obtain the CONVERSION FUNCTION
      4.6.5 IRRADIATION for determination of the NOISE POWER
            SPECTRUM
      4.6.6 IRRADIATION with TEST DEVICE in the RADIATION BEAM
5 Corrections of RAW DATA
6 Determination of the DETECTIVE QUANTUM EFFICIENCY
  6.1 Definition and formula of DQE(u,v)
  6.2 Parameters to be used for evaluation
  6.3 Determination of different parameters from the images
      6.3.1 Linearization of data
      6.3.2 The NOISE POWER SPECTRUM (NPS)
      6.3.3 Determination of the MODULATION TRANSFER FUNCTION
            (MTF)
7 Format of conformance statement
8 Accuracy
Annex A (normative) Determination of LAG EFFECTS
  A.1 Test of additive LAG EFFECTS
  A.2 Test of multiplicative LAG EFFECTS
Annex B (normative) Terminology - Index of defined terms
Annex C (informative) Calculation of the input NOISE POWER
                      SPECTRUM
Bibliography

Specifies the method for the determination of the detective quantum efficiency (DQE) of digital X-ray imaging devices as a function of exposure and of spatial frequency for the working conditions in the range of the medical application as specified by the manufacturer.Is applicable to projection digital X-ray imaging devices producing images in digital format that are used for medical diagnosis. It is restricted to digital X-ray imaging devices that are used for radiographic imaging, such as CR systems, selenium-based systems, flat panel detectors, optically coupled CCD detectors, and digital X-ray image intensifiers used for single exposures.