IEC 63003:2015
Current
The latest, up-to-date edition.
Standard for the common test interface pin map configuration for high-density, single-tier electronics test requirements utilizing IEEE Std 1505™
Hardcopy , PDF , PDF 3 Users , PDF 5 Users , PDF 9 Users
English
14-12-2015
Important note : Users cannot be edited or removed once added to your Multi user PDF.IEC 63003:2015(E) the scope is the definition of a pin map utilizing the IEEE 1505 receiver fixture interface (RFI). The pin map defined within this standard shall apply to military and aerospace automatic test equipment (ATE) testing applications.
| DevelopmentNote |
Also numbered as IEEE 1505.1. (12/2015)
|
| DocumentType |
Standard
|
| Pages |
162
|
| PublisherName |
International Electrotechnical Committee
|
| Status |
Current
|
| Standards | Relationship |
| NEN IEC 63003 : 2016 | Identical |
| BS IEC 63003:2015 | Identical |
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| IEEE 315 : 1975 | GRAPHIC SYMBOLS FOR ELECTRICAL AND ELECTRONICS DIAGRAMS (INCLUDING REFERENCE DESIGNATION LETTERS) |
| MIL-PRF-28800 Revision F:1996 | TEST EQUIPMENT FOR USE WITH ELECTRICAL AND ELECTRONIC EQUIPMENT, GENERAL SPECIFICATION FOR |
| MIL-HDBK-217 Revision F:1991 | RELIABILITY PREDICTION OF ELECTRONIC EQUIPMENT |
| IEEE 1149.1-2013 REDLINE | IEEE Standard for Test Access Port and Boundary-Scan Architecture |
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