IEC PAS 62189:2000
Superseded
A superseded Standard is one, which is fully replaced by another Standard, which is a new edition of the same Standard.
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Bias Life
Hardcopy , PDF , PDF 3 Users , PDF 5 Users , PDF 9 Users
23-02-2004
English
28-11-2000
Important note : Users cannot be edited or removed once added to your Multi user PDF.
FOREWORD
1 Purpose
2 Apparatus
3 Procedure
4 Cool-down
5 Measurements
6 Failure criteria
7 Summary
This test is performed to determine the effects of bias conditions and temperature on solid state devices over an extended period of time. It is intended primarily for device qualification and reliability monitoring.
| DocumentType |
Miscellaneous Product
|
| Pages |
6
|
| PublisherName |
International Electrotechnical Committee
|
| Status |
Superseded
|
| SupersededBy |
| Standards | Relationship |
| NEN NPR IEC/PAS 62189 : 2001 | Identical |
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