IEC TR 60444-4:1988
Current
The latest, up-to-date edition.
Measurement of quartz crystal unit parameters by zero phase technique in a pi-network. Part 4: Method for the measurement of the load resonance frequency fL, load resonance resistance RL and the calculation of other derived values of quartz crystal units, up to 30 MHz
Hardcopy , PDF , PDF 3 Users , PDF 5 Users , PDF 9 Users
English - French, Russian
30-06-1988
Specifies a simple method of measuring load resonance frequency. The method uses the change in resonance frequency which occurs when a load capacitance is inserted in series with the crystal unit.
Committee |
TC 49
|
DevelopmentNote |
Also numbered as BS EN 60444-4 (11/2005) Stability Date: 2017. (09/2017)
|
DocumentType |
Technical Report
|
Pages |
25
|
PublisherName |
International Electrotechnical Committee
|
Status |
Current
|
Standards | Relationship |
I.S. EN 60444-4:1999 | Identical |
PN EN 60444-4 : 1999 | Identical |
BS 7681-4(1993) : 1993 AMD 9660 | Similar to |
NEN EN IEC 60444-4 : 1997 | Identical |
SN EN 60444-4 : 1997 | Identical |
NF EN 60444-4 : 2001 | Identical |
DIN IEC 60444-4:1992-11 | Identical |
DIN EN 60444-4:1997-10 | Identical |
EN 60444-4:1997 | Identical |
UNE-EN 60444-4:1997 | Identical |
NF EN 60444-11 : 2011 | MEASUREMENT OF QUARTZ CRYSTAL UNIT PARAMETERS - PART 11: STANDARD METHOD FOR THE DETERMINATION OF THE LOAD RESONANCE FREQUENCY FL AND THE EFFECTIVE LOAD CAPACITANCE CLEFF USING AUTOMATIC NETWORK ANALYZER TECHNIQUES AND ERROR CORRECTION |
NF EN 60122-1 : 2003 | QUARTZ CRYSTAL UNITS OF ASSESSED QUALITY - PART 1: GENERIC SPECIFICATION |
EN 168000 : 1993 AMD 2 1998 | GENERIC SPECIFICATION - QUARTZ CRYSTAL UNITS |
I.S. EN 168000:1994 | QUARTZ CRYSTAL UNITS (GENERIC SPECIFICATION) |
IEC PAS 62277:2001 | Test-fixture of surface mounting quartz crystal units |
BS EN 168000:1996 | Harmonized system of quality assessment for electronic components. Generic specification: quartz crystal units |
EN 60444-11:2010 | Measurement of quartz crystal unit parameters - Part 11: Standard method for the determination of the load resonance frequency fL and the effective load capacitance CLeff using automatic network analyzer techniques and error correction |
08/30180527 DC : DRAFT JULY 2008 | BS EN 60444-11 - MEASUREMENT OF QUARTZ CRYSTAL UNIT PARAMETERS - PART 11: STANDARD METHOD FOR THE DETERMINATION OF THE LOAD RESONANCE FREQUENCY FL AND THE EFFECTIVE LOAD CAPACITANCE CLEFF USING AUTOMATIC NETWORK ANALYZER TECHNIQUES AND ERROR CORRECTION |
BS EN 60444-11:2010 | Measurement of quartz crystal unit parameters Standard method for the determination of the load resonance frequency ƒL and the effective load capacitance CLeff using automatic network analyzer techniques and error correction |
CEI EN 60444-11 : 2011 | MEASUREMENT OF QUARTZ CRYSTAL UNIT PARAMETERS - PART 11: STANDARD METHOD FOR THE DETERMINATION OF THE LOAD RESONANCE FREQUENCY F[L] AND THE EFFECTIVE LOAD CAPACITANCE C[LEFF] USING AUTOMATIC NETWORK ANALYZER TECHNIQUES AND ERROR CORRECTION |
BS EN 60122-1 : 2002 | QUARTZ CRYSTAL UNITS OF ASSESSED QUALITY - PART 1: GENERIC SPECIFICATION |
IEC 61178-1:1993 | Quartz crystal units - A specification in the IEC Quality Assessment System for Electronic Components (IECQ) - Part 1: Generic specification |
I.S. EN 60122-1:2002 AMD 1 2018 | QUARTZ CRYSTAL UNITS OF ASSESSED QUALITY - PART 1: GENERIC SPECIFICATION |
CEI EN 60122-1 : 2004 | QUARTZ CRYSTAL UNITS OF ASSESSED QUALITY - PART 1: GENERIC SPECIFICATION |
I.S. EN 60444-11:2010 | MEASUREMENT OF QUARTZ CRYSTAL UNIT PARAMETERS - PART 11: STANDARD METHOD FOR THE DETERMINATION OF THE LOAD RESONANCE FREQUENCY F[L] AND THE EFFECTIVE LOAD CAPACITANCE C[LEFF] USING AUTOMATIC NETWORK ANALYZER TECHNIQUES AND ERROR CORRECTION |
IEC 60444-11:2010 | Measurement of quartz crystal unit parameters - Part 11: Standard method for the determination of the load resonance frequency f<sub>L</sub> and the effective load capacitance C<sub>Leff</sub> using automatic network analyzer techniques and error correction |
EN 60122-1:2002/A1:2018 | QUARTZ CRYSTAL UNITS OF ASSESSED QUALITY - PART 1: GENERIC SPECIFICATION (IEC 60122-1:2002/A1:2017) |
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