IEC TS 62916:2017
Current
The latest, up-to-date edition.
Photovoltaic modules - Bypass diode electrostatic discharge susceptibility testing
Hardcopy , PDF
English
10-04-2017
FOREWORD
1 Scope
2 Normative references
3 Terms, definitions and abbreviated terms
4 General
5 Sampling
6 Test equipment
7 Test method
8 Data analysis
9 Report
Annex A (informative) - Guidelines for application
Annex B (informative) - Example of application
IEC TS 62916:2017(E) describes a discrete component bypass diode electrostatic discharge (ESD) immunity test and data analysis method. The test method described subjects a bypass diode to a progressive ESD stress test and the analysis method provides a means for analyzing and extrapolating the resulting failures using the two-parameter Weibull distribution function. It is the object of this document to establish a common and reproducible test method for determining diode surge voltage tolerance consistent with an ESD event during the manufacturing, packaging, transportation or installation processes of PV modules.
| Committee |
TC 82
|
| DevelopmentNote |
Stability Date: 2019. (04/2017)
|
| DocumentType |
Technical Specification
|
| Pages |
13
|
| PublisherName |
International Electrotechnical Committee
|
| Status |
Current
|
| Standards | Relationship |
| PD IEC/TS 62916:2017 | Identical |
| PD IEC/TS 62941:2016 | Terrestrial photovoltaic (PV) modules. Guidelines for increased confidence in PV module design qualification and type approval |
| IEC TS 62941:2016 | Terrestrial photovoltaic (PV) modules - Guideline for increased confidence in PV module design qualification and type approval |
| IEC 61000-4-2:2008 | Electromagnetic compatibility (EMC) - Part 4-2: Testing and measurement techniques - Electrostatic discharge immunity test |
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