IEEE 1149.1-2001
Superseded
Superseded
A superseded Standard is one, which is fully replaced by another Standard, which is a new edition of the same Standard.
View Superseded by
IEEE Standard Test Access Port and Boundary Scan Architecture
Available format(s)
PDF
Language(s)
English
Published date
23-07-2001
Superseded date
15-10-2021
Superseded by
€144.90
Excluding VAT
| Committee |
Test Technology
|
| DocumentType |
Standard
|
| Pages |
212
|
| PublisherName |
Institute of Electrical & Electronics Engineers
|
| Status |
Superseded
|
| SupersededBy | |
| Supersedes |
| IEEE 1581-2011 | IEEE Standard for Static Component Interconnection Test Protocol and Architecture |
| IEEE 1904.1-2017 REDLINE | IEEE Standard for Service Interoperability in Ethernet Passive Optical Networks (SIEPON) |
| IEEE 1149.8.1-2012 | IEEE Standard for Boundary-Scan-Based Stimulus of Interconnections to Passive and/or Active Components |
| IEEE 1149.7-2009 | IEEE Standard for Reduced-Pin and Enhanced-Functionality Test Access Port and Boundary-Scan Architecture |
| IEEE 1532-2002 | IEEE Standard for In-System Configuration of Programmable Devices |
| DSCC 93118E:2024 | MICROCIRCUIT, DIGITAL, ADVANCED CMOS, SERIALLY CONTROLLED ACCESS NETWORK, TRANSPARENT LATCH WITH THREE-STATE OUTPUTS, TTL COMPATIBLE INPUTS, MONOLITHIC SILICON |
| DSCC 93127D:2024 | MICROCIRCUIT, DIGITAL, ADVANCED CMOS, SERIALLY CONTROLLED ACCESS NETWORK, INVERTING LINE DRIVER WITH THREE-STATE OUTPUTS, TTL COMPATIBLE INPUTS, MONOLITHIC SILICON |
| IEEE 1687-2014 | IEEE Standard for Access and Control of Instrumentation Embedded within a Semiconductor Device |
| IEEE 1149.4-2010 | IEEE Standard for a Mixed-Signal Test Bus |
| IEEE 1500-2005 | IEEE Standard Testability Method for Embedded Core-based Integrated Circuits |
| IEEE 1904.1-2013 | IEEE Standard for Service Interoperability in Ethernet Passive Optical Networks (SIEPON) |
| IEEE 1149.4-1999 | IEEE Standard for a Mixed-Signal Test Bus |
| IEEE 1076-1993 | IEEE Standard VHDL Language Reference Manual |
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