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IEEE 1149.1-2001

Superseded

Superseded

A superseded Standard is one, which is fully replaced by another Standard, which is a new edition of the same Standard.

View Superseded by

IEEE Standard Test Access Port and Boundary Scan Architecture

Available format(s)

PDF

Superseded date

15-10-2021

Superseded by

IEEE 1149.1-2013 REDLINE

Language(s)

English

Published date

23-07-2001

€156.03
Excluding VAT

Committee
Test Technology
DocumentType
Standard
Pages
212
PublisherName
Institute of Electrical & Electronics Engineers
Status
Superseded
SupersededBy
Supersedes

IEEE 1581-2011 IEEE Standard for Static Component Interconnection Test Protocol and Architecture
IEEE 1904.1-2017 IEEE Standard for Service Interoperability in Ethernet Passive Optical Networks (SIEPON)
IEEE 1149.8.1-2012 IEEE Standard for Boundary-Scan-Based Stimulus of Interconnections to Passive and/or Active Components
IEEE 1149.7-2009 IEEE Standard for Reduced-Pin and Enhanced-Functionality Test Access Port and Boundary-Scan Architecture
IEEE 1532-2002 IEEE Standard for In-System Configuration of Programmable Devices
DSCC 93118E:2024 MICROCIRCUIT, DIGITAL, ADVANCED CMOS, SERIALLY CONTROLLED ACCESS NETWORK, TRANSPARENT LATCH WITH THREE-STATE OUTPUTS, TTL COMPATIBLE INPUTS, MONOLITHIC SILICON
DSCC 93127D:2024 MICROCIRCUIT, DIGITAL, ADVANCED CMOS, SERIALLY CONTROLLED ACCESS NETWORK, INVERTING LINE DRIVER WITH THREE-STATE OUTPUTS, TTL COMPATIBLE INPUTS, MONOLITHIC SILICON
IEEE 1687-2014 IEEE Standard for Access and Control of Instrumentation Embedded within a Semiconductor Device
IEEE 1149.4-2010 IEEE Standard for a Mixed-Signal Test Bus
IEEE 1500-2005 IEEE Standard Testability Method for Embedded Core-based Integrated Circuits
IEEE 1904.1-2013 IEEE Standard for Service Interoperability in Ethernet Passive Optical Networks (SIEPON)

IEEE 1149.4-1999 IEEE Standard for a Mixed-Signal Test Bus
IEEE 1076-1993 IEEE Standard VHDL Language Reference Manual

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