IEEE 1149.8.1-2012
Withdrawn
A Withdrawn Standard is one, which is removed from sale, and its unique number can no longer be used. The Standard can be withdrawn and not replaced, or it can be withdrawn and replaced by a Standard with a different number.
IEEE Standard for Boundary-Scan-Based Stimulus of Interconnections to Passive and/or Active Components
30-03-2023
English
09-08-2012
1. Overview
2. Normative references
3. Definitions
4. Technology
5. Instructions
6. Pin implementation specifications
7. Toggle_Control register
8. Conformance and documentation requirements
Annex A (informative) - Unpowered testing for open
connections on printed circuit assemblies
Annex B (informative) - Boundary register cells that
support ST-pins and IEEE 1149.6 ac-pins
Annex C (informative) - Bibliography
Describes extensions to IEEE 1149.1[TM] that define the boundary-scan structures and methods required to facilitate boundary-scan-based stimulus of interconnections to passive and/or active components.
Committee |
Test Technology
|
DocumentType |
Standard
|
ISBN |
978-0-7381-7392-4
|
Pages |
95
|
PublisherName |
Institute of Electrical & Electronics Engineers
|
Status |
Withdrawn
|
DEFSTAN 66-031(PT8)/2(2016) : 2016 | REQUIREMENTS FOR ELECTRONIC AND ELECTRICAL TEST AND MEASUREMENT EQUIPMENT - PART 8: REQUIREMENTS FOR AUTOMATIC TEST SYSTEMS UTILISING AN OPEN SYSTEM ARCHITECTURE |
IEEE 1149.6-2003 | IEEE Standard for Boundary-Scan Testing of Advanced Digital Networks |
IEEE 1149.1-2013 REDLINE | IEEE Standard for Test Access Port and Boundary-Scan Architecture |
IEEE 1149.1-2001 | IEEE Standard Test Access Port and Boundary Scan Architecture |
IEEE 1149.6-2003 | IEEE Standard for Boundary-Scan Testing of Advanced Digital Networks |
IEEE 1149.1-2013 REDLINE | IEEE Standard for Test Access Port and Boundary-Scan Architecture |
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